Abstract
As an advanced manufacturing paradigm, Cloud Manufacturing provides a new way to solve the problems in the testing process. In cloud manufacturing, resource perception and resource virtualization are the foundation of building an actual service platform. According to the characteristic of test equipment, a practical approach for test equipment perception and virtualization is proposed, which is based on cloud computing, Automatic Test Markup Language (ATML) description and data mapping. A test service platform prototype is given to validate the feasibility of this approach.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Zhang L, Luo Y, Tao F, Li BH, Ren L, Zhang X, et al. Cloud manufacturing: a new manufacturing paradigm. Enterp Inf Syst. 2012;8(2):1–21.
Bo-Hu LI, Zhang L, Wang SL, Tao F, Cao JW, Jiang XD, et al. Cloud manufacturing: a new service-oriented networked manufacturing model. Comput Integr Manuf Syst. 2010;16(1):1−7.
Adamson G, Wang L, Holm M, Moore P. Cloud manufacturing—a critical review of recent development and future trends. Int J Comput Integr Manuf. 2015; 1−34.
Tao F, Zuo Y, Xu LD, Zhang L. Iot-based intelligent perception and access of manufacturing resource toward cloud manufacturing. IEEE Trans Industr Inf. 2014;10(2):1547–57.
Qu T, Lei SP, Wang ZZ, Nie DX, Chen X, Huang GQ. Iot-based real-time production logistics synchronization system under smart cloud manufacturing. Int J Adv Manuf Technol. 2016;84(1):147–64.
Lei R, Lin Z, Zhang YB, Fei T, Luo YL. Resource virtualization in cloud manufacturing. Jisuanji Jicheng Zhizao Xitong/comput Integr Manuf Syst Cims. 2011;17(3):511–8.
Wang XV, Xu XW. Virtualize manufacturing Capabilities in the cloud: requirements and architecture. In: International Manufacturing Science and Engineering Conference Collocated with the, North American Manufacturing Research Conference. ASME;2013. pp.V002T02A002-V002T02A002.
Hu L, Xiao M. The future of automatic test system (ats) brought by cloud computing. 2009;412−4.
Heng-Jing HE, Zhao W, Huang SL. Research on the instrumentation virtualization in cloud computing environment. Electr Measur Instrum. 2014.
Ding C, Tang LW, Deng SJ. A structure of cloud test system for signal test. Key Eng Mater. 2016;693:1314–20.
1671−2010—IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML.
Lehmann M, Biørn-Hansen A, Ghinea G, Grønli TM, Younas M. Data analysis as a service: an infrastructure for storing and analyzing the internet of things. In: International Conference on Mobile Web and Information Systems 2015 August. Springer International Publishing;2015. p. 161−9.
Acknowledgements
The research is supported by the National High-Tech Research and Development Plan of China under Grant No. 2015AA042101 and Fund of State Key Laboratory of Intelligent Manufacturing System Technology in China.
Author information
Authors and Affiliations
Corresponding authors
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Singapore Pte Ltd.
About this paper
Cite this paper
Xu, Y., Zhang, L., Luo, X., Zhang, H. (2018). A Practical Approach for Test Equipment Perception and Virtualization in Cloud Manufacturing. In: Jia, Y., Du, J., Zhang, W. (eds) Proceedings of 2017 Chinese Intelligent Systems Conference. CISC 2017. Lecture Notes in Electrical Engineering, vol 460. Springer, Singapore. https://doi.org/10.1007/978-981-10-6499-9_15
Download citation
DOI: https://doi.org/10.1007/978-981-10-6499-9_15
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-6498-2
Online ISBN: 978-981-10-6499-9
eBook Packages: EngineeringEngineering (R0)