Abstract
AFM was developed to overcome a drawback of scanning tunneling microscopy (STM), which can only image conducting surfaces.
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References
Wolter, O., Bayer, Th, Greschner, J.: Micromachined silicon sensors for scanning force microscopy. J. Vac. Sci. Technol. B 9, 1353–1357 (1991)
Giessibl, F.J., Binnig, G.: Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum. Ultramicroscopy 42–44, 281–289 (1992)
Giessibl, F.J.: Advances in atomic force microscopy. Rev. Mod. Phys. 75, 949–983 (2003)
Lee, G.U., Chrisey, L.A., Colton, R.J.: Direct measurement of the forces between complementary strands of DNA. Science 266, 771–773 (1994)
Xu, B., Xiao, X., Tao, N.J.: J. Am. Chem. Soc. 125, 16164–16165 (2003)
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Fujii, S. (2018). Atomic Force Microscope. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_6
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DOI: https://doi.org/10.1007/978-981-10-6156-1_6
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