Abstract
The basic principle of high-speed atomic force microscopy (HS-AFM) is similar to a conventional AFM in which force interactions between a sharp needle at the end of a cantilever and a solid surface is detected through the deflection of the cantilever (Binnig et al. Phys Rev Let 56:930–933, 1986 [1]).
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References
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Uchihashi, T. (2018). High-Speed Atomic Force Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_43
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DOI: https://doi.org/10.1007/978-981-10-6156-1_43
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