High-Speed Atomic Force Microscopy

  • Takayuki UchihashiEmail author


The basic principle of high-speed atomic force microscopy (HS-AFM) is similar to a conventional AFM in which force interactions between a sharp needle at the end of a cantilever and a solid surface is detected through the deflection of the cantilever (Binnig et al. Phys Rev Let 56:930–933, 1986 [1]).


Single-molecule imaging Protein Conformational dynamics Molecular interaction 


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© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Department of PhysicsNagoya UniversityAichiJapan

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