Glow Discharge Optical Emission Spectrometry

  • Patrick ChaponEmail author
  • Sofia Gaiaschi
  • Kenichi Shimizu


GDOES [1] is a spectrochemical technique that allows direct in-depth determination of major and trace elements. In GDOES a pulsed radio frequency


Plasma Elemental analysis Fast depth profiling Thin and thick films 


  1. 1.
    Nelis, T., Payling, R.: Practical guide to glow discharge optical emission spectrometry. Royal Society of Chemistry (2003)Google Scholar
  2. 2.
    Belenguer, Ph, Ganciu, M., Guillot, Ph, Nelis, Th: Pulsed glow discharges for analytical applications. Spectrochimica Acta Part B 64, 623–641 (2009)CrossRefGoogle Scholar
  3. 3.
    Ber, B., Bábor, P., Brunkov, P.N., Chapon, P., Drozdov, M.N., Duda, R., Kazantsev, D., Polkovnikov, V., Yunin, P., Tolstogouzov, A.: Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: a round-robin characterization by different techniques. Thin Solid Films 540, 96–105 (2013)CrossRefGoogle Scholar
  4. 4.
    Shimizu, K., Payling, R., Habazaki, H., Skeldon, P., Thompson, G.E.: Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper. J. Anal. At. Spectrom. 19, 1–5 (2004)CrossRefGoogle Scholar
  5. 5.
    Mercier, D., Bouttemy, M., Vigneron, J., Chapon, P., Etcheberry, A.: GD-OES and XPS coupling: a new way for the chemical profiling of photovoltaic absorbers. Appl. Surf. Sci. 347, 799–807 (2015)CrossRefGoogle Scholar
  6. 6.
    Molchan, I.S., Thompson, G.E., Skeldon, P., Trigoulet, N., Chapon, P., Tempez, A., Malherbe, J., Lobo Revilla, L., Bordel, N., Belenguer, Ph, Nelis, T., Zhari, A., Thérèse, L., Guillot, Ph, Ganciu, M., Michlert, J., Hohl, M.: The concept of plasma cleaning in glow discharge spectrometry. J. Anal. At. Spectrom. 24, 734–741 (2009)CrossRefGoogle Scholar
  7. 7.
    Saito, Y., Rahman, M.K.: Investigation of positive electrodes after cycle testing of high power Li-ion battery cells IV. An approach to the power fading mechanisms by depth profile analysis of electrodes using glow discharge optical emission spectroscopy. J. Power Sources 174, 877–882 (2007)CrossRefGoogle Scholar
  8. 8.
    Hatano, Y., Shi, J., Yoshida, N., Futagami, N., Oya, Y., Nakamura, H.: Measurement of deuterium and helium by glow-discharge optical emission spectroscopy for plasma–surface interaction studies. Fusion Eng. Des. 87, 1091–1094 (2012)CrossRefGoogle Scholar
  9. 9.
    Warwick, M.E.A., Hyett, G., Ridley, I., Laffir, F.R., Olivero, C., Chapon, P., Binions, R.: Synthesis and energy modeling studies of titanium oxy-nitride films as energy efficient glazing. Sol. Energy Mater. Sol. Cells 118, 149–156 (2013)CrossRefGoogle Scholar
  10. 10.
    Torok, T., Levai, G., Szabo, M., Pallosi, J.: Characterizing coatings of car body sheets by GDOES. In: Makhlouf, A. (eds.) High performance coatings for automotive and aerospace industries. Nova Science Publishers (2010)Google Scholar
  11. 11.
    Lanzutti, A., Marin, E., Lekka, M., Chapon, P., Fedrizzi, L.: RF GDOES analysis of composite metal/ceramic electroplated coatings with nano-to microceramic particles’size. Surf, Interface Anal (2011)Google Scholar
  12. 12.
    Shimizu, K., Mitani, T.: New horizons of applied scanning electron microscopy. Springer (2010)Google Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  • Patrick Chapon
    • 1
    Email author
  • Sofia Gaiaschi
    • 1
  • Kenichi Shimizu
    • 2
  1. 1.HORIBA France SASPalaiseauFrance
  2. 2.Keio UniversityYokohamaJapan

Personalised recommendations