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Compendium of Surface and Interface Analysis pp 193–200Cite as

Force Spectroscopy

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Abstract

Using atomic force microscopy (AFM) in force spectroscopy (FS) mode is a powerful tool to study the fundamental surface, physicochemical and biological forces between an AFM tip and a surface, molecule or living cell of interest.

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Authors and Affiliations

  1. ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute/AIIM Facility, Innovation Campus Squires Way, University of Wollongong, Wollongong, NSW, 2500, Australia

    Christina Puckert & Michael J. Higgins

Authors
  1. Christina Puckert
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  2. Michael J. Higgins
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Corresponding author

Correspondence to Michael J. Higgins .

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Editors and Affiliations

  1. Tokyo, Japan

    The Surface Science Society of Japan

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© 2018 Springer Nature Singapore Pte Ltd.

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Puckert, C., Higgins, M.J. (2018). Force Spectroscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_33

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