Electrochemical Atomic Force Microscopy
Atomic force microscopy (AFM) can image the surfaces of flat materials, irrespective of their conductivity. The sample is usually imaged in air, but can be in liquid environments and under vacuum, as described in other chapters (Chaps. 6, and 55). AFM has also been applied to the electrode/electrolyte interfaces, since its invention.
KeywordsElectrochemistry Electrode/electrolyte interfaces In situ Solvation Force spectroscopy
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