Skip to main content

Gamma Degradation Models: Inference and Optimal Design

  • Chapter
  • First Online:
Statistical Modeling for Degradation Data

Part of the book series: ICSA Book Series in Statistics ((ICSABSS))

Abstract

During the past two decades, degradation analysis has been widely used to assess the lifetime information of highly reliable products. Usually, random effect models and/or Wiener processes are well suited for modelling stochastic degradation. But in many situations, such as materials that lead to fatigue, it is more appropriate to model the degradation data by a gamma degradation process which exhibits a monotone increasing pattern. This article surveys the theoretical aspects as well as the application of gamma processes in degradation analysis. Some statistical properties of degradation models based on gamma processes under different tests are also given. Furthermore, the corresponding optimal designs for conducting the degradation experiments efficiently are reviewed. Finally, some extensions and their applications of gamma-process degradation model are presented.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 89.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 119.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Amini M, Shemehsavar S, Pan Z (2016) Optimal design for step-stress accelerated test with random discrete stress elevating times based on gamma degradation process. Qual Reliab Eng Int 32:2391–2402

    Article  Google Scholar 

  2. Bagdonavicius V, Nikulin M (2002) Accelerated life models, modeling and statistical analysis. Chapman & Hall, Boca Raton

    Google Scholar 

  3. Balakrishnan N, Ling MH (2014) Best constant-stress accelerated life-test plans with multiple stress factors for one-shot device testing under a weibull distribution. IEEE Trans Reliab 63:944–952

    Article  Google Scholar 

  4. Bordes L, Paroissin C, Salami A (2016) Parametric inference in a perturbed gamma degradation process. Commun Stat Theory Methods 45:2730–2747

    Article  MathSciNet  MATH  Google Scholar 

  5. Chao MT (1999) Degradation analysis and related topics: some thoughts and a review. Proc Nat Sci Counc Ser A23:555–566

    Google Scholar 

  6. Chiang JY, Sung WY, Tsai TR, Lio Y (2015) Sensitivity analysis of sample allocation and measurement frequency under a degradation test with gamma process. ICIC Express Lett Part B Appl 6:737–742

    Google Scholar 

  7. Doksum KA, Hóyland A (1992) Model for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution. Technometrics 34:74–82

    Article  MATH  Google Scholar 

  8. Doksum KA, Normand S-LT (1995) Gaussian models for degradation processes – part I: methods for the analysis of biomarker data. Lifetime Data Anal 1:135–144

    Article  MATH  Google Scholar 

  9. Fan TH, Hsu TM (2012) Accelerated life tests of a series system with masked interval data under exponential lifetime distributions. IEEE Trans Reliab 61:798–808

    Article  Google Scholar 

  10. Fan TH, Hsu TM (2014) Constant stress accelerated life test on a multiple-component series system under Weibull lifetime distributions. Commun Stat Theory Methods 43:2370–2383

    Article  MathSciNet  MATH  Google Scholar 

  11. Guan Q, Tang YC (2013) Optimal design of accelerated degradation test based on gamma process models. Chin J Appl Probab Stat 29:213–224

    MathSciNet  MATH  Google Scholar 

  12. Kallen MJ, van Noortwijk JM (2005) Optimal maintenance decisions under imperfect inspection. Reliab Eng Syst Saf 90:177–185

    Article  Google Scholar 

  13. Khanh LS, Mitra F, Anne B (2016) Remaining useful lifetime estimation and noisy gamma deterioration process. Reliab Eng Syst Saf 149:76–87

    Article  Google Scholar 

  14. Lawless J, Crowder M (2004) Covariates and random effects in a gamma process model with application to degradation and failure. Lifetime Data Anal 10:213–227

    Article  MathSciNet  MATH  Google Scholar 

  15. Li X, Zou T, Fan Y (2015) Bayesian optimal design for step-stress accelerated degradation testing based on gamma process and relative entropy. Lect Notes Mech Eng 19:957–967

    Article  Google Scholar 

  16. Lim H (2015) Optimum accelerated degradation tests for the gamma degradation process case under the constraint of total cost. Entropy 17:2556–2572

    Article  Google Scholar 

  17. Ling MH, Tsui KL, Balakrishnan N (2015) Accelerated degradation analysis for the quality of a system based on the gamma process. IEEE Trans Reliab 64:463–472

    Article  Google Scholar 

  18. Lu CJ, Meeker WQ (1993) Using degradation measures to estimate a time-to-failure distribution. Technometrics 35:161–174

    Article  MathSciNet  MATH  Google Scholar 

  19. Lu DJ, Pandey MD, Xie WC (2013) An efficient method for the estimation of parameters of stochastic gamma process from noisy degradation measurements. J Risk Reliab 227:425–433

    Google Scholar 

  20. Meeker WQ, Escobar LA (1998) Statistical methods for reliability data. John Wiley & Sons, New York

    Google Scholar 

  21. Nelson W (1990) Accelerated testing: statistical models, test plans, and data analysis. John Wiley & Sons, New York

    Google Scholar 

  22. Pan Z, Balakrishnan N (2010) Multiple-steps step-stress accelerated degradation modeling based on Wiener and gamma processes. Commun Stat Simul Comput 39:1384–1402

    Article  MathSciNet  MATH  Google Scholar 

  23. Pan Z, Balakrishnan N (2011) Reliability modeling of degradation of products with multiple performance characteristics based on gamma processes. Reliab Eng Syst Saf 96:949–957

    Article  Google Scholar 

  24. Pan Z, Feng J, Sun Q (2016) Lifetime distribution and associated inference of systems with multiple degradation measurements based on gamma processes. Eksploatacja i Niezawodnosc 18:307–313

    Article  Google Scholar 

  25. Pan Z, Sun Q, Feng J (2016) Reliability modeling of systems with two dependent degrading components based on gamma processes. Commun Stat Theory Methods 45:1923–1938

    Article  MathSciNet  MATH  Google Scholar 

  26. Park C, Padgett WJ (2005) Accelerated degradation models for failure based on geometric Brownian motion and gamma process. Lifetime Data Anal 11:511–527

    Article  MathSciNet  MATH  Google Scholar 

  27. Park C, Padgett WJ (2006) Stochastic degradation models with several accelerating variables. IEEE Trans Reliab 55:379–390

    Article  Google Scholar 

  28. Park SH, Kim JH (2016) Lifetime estimation of LED lamp using gamma process model. Microelectron Reliab 57:71–78

    Article  Google Scholar 

  29. Peng CY, Tseng ST (2009) Mis-specification analysis of linear degradation models. IEEE Trans Reliab 58:444–455

    Article  Google Scholar 

  30. Peng CY, Tseng ST (2013) Statistical lifetime inference with skew-Wiener linear degradation models. IEEE Trans Reliab 62:338–350

    Article  Google Scholar 

  31. Pulcini G (2016) A perturbed gamma process with statistically dependent measurement errors. Reliab Eng Syst Saf 152:296–306

    Article  Google Scholar 

  32. Si XS, Wang W, Hu CH, Zhou DH, Pecht MG (2012) Remaining useful life estimation based on a nonlinear diffusion degradation process. IEEE Trans Reliab 61:50–67

    Article  Google Scholar 

  33. Singpurwalla ND (1995) Survival in dynamic environments. Stat Sci 10:86–103

    Article  MATH  Google Scholar 

  34. Tang J, Su TS (2008) Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model. Nav Res Logist 55:265–276

    Article  MathSciNet  MATH  Google Scholar 

  35. Tsai CC, Tseng ST, Balakrishnan N (2011) Mis-specification analyses of gamma and Wiener degradation processes. J Stat Plan Inference 141:3725–3735

    Article  MathSciNet  MATH  Google Scholar 

  36. Tsai CC, Tseng ST, Balakrishnan N (2011) Optimal burn-in policy for highly reliable products using gamma degradation process. IEEE Trans Reliab 60:234–245

    Article  Google Scholar 

  37. Tsai CC, Tseng ST, Balakrishnan N (2012) Optimal design for degradation tests based on gamma processes with random effects. IEEE Trans Reliab 61:604–613

    Article  Google Scholar 

  38. Tsai TR, Sung WY, Lio YL, Chang SI, Lu JC (2016) Optimal two-variable accelerated degradation test plan for gamma degradation processes. IEEE Trans Reliab 65:459–468

    Article  Google Scholar 

  39. Tseng ST, Tang J, Ku IH (2003) Determination of burn-in parameters and residual life for highly reliable products. Nav Res Logist 50:1–14

    Article  MathSciNet  MATH  Google Scholar 

  40. Tseng ST, Balakrishnan N, Tsai CC (2009) Optimal step-stress accelerated degradation test plan for gamma degradation processes. IEEE Trans Reliab 58:611–618

    Article  Google Scholar 

  41. van Noortwijk JM (2009) A survey of the application of gamma processes in maintenance. Reliab Eng Syst Saf 94:2–21

    Article  Google Scholar 

  42. Wang X (2008) A pseudo-likelihood estimation method for nonhomogeneous gamma process model with random effects. Stat Sin 18:1153–1163

    MathSciNet  MATH  Google Scholar 

  43. White LV (1973) An extension of the general equivalence theorem to nonlinear models. Biometrika 60:345–348

    Article  MathSciNet  MATH  Google Scholar 

  44. White H (1982) Maximum likelihood estimation of misspecified models. Econometrica 50: 1–25

    Article  MathSciNet  MATH  Google Scholar 

  45. Whitmore GA, Schenkelberg F (1997) Modelling accelerated degradation data using Wiener diffusion with a time scale transformation. Lifetime Data Anal 3:27–45

    Article  MATH  Google Scholar 

  46. Yang G (2007) Life cycle reliability engineering. John Wiley & Sons, Hoboken

    Google Scholar 

  47. Ye ZS, Shen Y, Xie M (2012) Degradation-based burn-in with preventive maintenance. Eur J Oper Res 62:360–367

    Article  MathSciNet  MATH  Google Scholar 

  48. Ye ZS, Wang Y, Tsui KL, Pecht M (2013) Degradation data analysis using Wiener processes with measurement errors. IEEE Trans Reliab 62:772–780

    Article  Google Scholar 

  49. Ye ZS, Xie M, Shen Y, Tang LC (2012) Degradation-based burn-in planning under competing risks. Technometrics 54:159–168

    Article  MathSciNet  Google Scholar 

  50. Ye ZS, Xie M, Tang LC, Chen N (2014) Semiparametric estimation of gamma processes for deteriorating products. Technometrics 56:504–513

    Article  MathSciNet  Google Scholar 

  51. Yu HF, Tseng ST (2002) Designing a screening degradation experiment. Nav Res Logist 49:514–526

    Article  MATH  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to N. Balakrishnan .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2017 Springer Nature Singapore Pte Ltd.

About this chapter

Cite this chapter

Balakrishnan, N., Tsai, CC., Lin, CT. (2017). Gamma Degradation Models: Inference and Optimal Design. In: Chen, DG., Lio, Y., Ng, H., Tsai, TR. (eds) Statistical Modeling for Degradation Data. ICSA Book Series in Statistics. Springer, Singapore. https://doi.org/10.1007/978-981-10-5194-4_9

Download citation

Publish with us

Policies and ethics