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De-noising Method Research on RF Signal by Combining Wavelet Transform and SVD

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Proceedings of the 28th Conference of Spacecraft TT&C Technology in China (TT&C 2016)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 445))

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Abstract

RF signal are widely used in many fields such as aerospace measurement and control field for its space distance transmission characteristics. However, noise and interference would be brought in through space magnetic field, channels, equipment components and so on, which would affect spread, analysis and processing of RF signal. There are little research about RF signal de-noising at present. Traditional filter de-noising method, wavelet threshold method and SVD method were studied comparatively in RF signal. Simulation results and extraction effects of useful RF signal were analyzed by different methods. The effection of noise suppression was realized by those three methods above, but they all had shortcomings. Filter method decreased signal energy significantly, wavelet transform method was easy to lead to the distortion of reconstruction signal, and SVD method needed longer operation time. For those disadvantages, method of combining wavelet threshold and SVD was put forward to reduce the noise. And by this way, it improved the operation efficiency, and the effectiveness and superiority of noise suppression were verified by de-noising performance metrics.

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Correspondence to Junyao Li .

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© 2018 Tsinghua University Press, Beijing and Springer Nature Singapore Pte Ltd.

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Li, J., Li, Y., Wang, X., Zhang, P. (2018). De-noising Method Research on RF Signal by Combining Wavelet Transform and SVD. In: Shen, R., Dong, G. (eds) Proceedings of the 28th Conference of Spacecraft TT&C Technology in China. TT&C 2016. Lecture Notes in Electrical Engineering, vol 445. Springer, Singapore. https://doi.org/10.1007/978-981-10-4837-1_38

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  • DOI: https://doi.org/10.1007/978-981-10-4837-1_38

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-4836-4

  • Online ISBN: 978-981-10-4837-1

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