Skip to main content

Processing the Reflectance Data of Rough Surface for Inversing the Index of Refraction

  • Conference paper
  • First Online:
Book cover Proceedings of the 28th Conference of Spacecraft TT&C Technology in China (TT&C 2016)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 445))

Included in the following conference series:

Abstract

Inversion of the complex index of refraction will influence object’s polarized characteristics. In this paper, a new method is proposed based on Vimal–Milo method. Analyze the characteristics of reflectance from rough surface and point out the defects of the current methods which avoids the unpolarized component when calculating. Analyze the relative polarized component, derive the inversion model, and devise an algorithm for the optimum solution of the formula using Hooke–Jeeves method. Carry out the inversing and forward simulation using the measurements of the polarization for green paint and Aluminum. The inversing data shows that the precisions are highly improved by 37.8 times and 10 times than Vimal–Milo method, and errors are well within ±0.01, while the forward data shows that the error of green paint decrease 24 times and errors are within 0.0055.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Lu WG, WU YM, GAO LM et al (2013) Rapid measurement of spatial azimuth by using polarized light. Opt Precis Eng 21(3):539–545

    Article  Google Scholar 

  2. Kerekes J, Hart C, Gartley M et al (2010) Characterization of material reflectance variation through measurements and simulation. In: Proceedings of SPIE 7695(0P), pp 1–11

    Google Scholar 

  3. Wang X, Zou XF, JIN WQ (2011) Study of polarization properties of radiation reflected by roughness objects. Trans Beijing Inst Technol 31(11):1327–1331

    Google Scholar 

  4. Zhang Y, Zhao HJ, XING H et al (2009) Polarization aberrations of transmitting rotationally symmetric optical systems. Opt Precis Eng 22(5):757–762

    Google Scholar 

  5. Sawyer MA, Hyde MW (2013) Material characterization using passive multispectral polarimetric imagery. In: Proceedings of SPIE 8873(0Y), pp 1–15

    Google Scholar 

  6. Li-xiang MA, Fan-ming LI, Ji-yong NIU et al (2013) Polarization model based on complex refractive index and its applications. Laser Infrared 43(10):1338–1341

    Google Scholar 

  7. Li Q, Yang RF, ZHAI Y et al (2013) Nondestructive measurement of refractive index of capillary in non-paraxial conditions. Opt Precis Eng 21(3):616–623

    Article  Google Scholar 

  8. Thilak V, Creusere CD, Voelz DG (2006) Estimating the complex index of refraction and view angle of object using multiple polarization measurements. IEEE (1-4244-0785-0/06), pp 1067–1071

    Google Scholar 

  9. Thilak V, Voelz DG, Creusere CD (2007) Polarization-based index of refraction and reflection angle estimation for remote sensing applications. Appl Opt 46(30):7527–7536

    Article  Google Scholar 

  10. Liu Q, Zhan YH, Yang D et al (2014) Methods of modeling of polarized BRDF for rough surfaces. J Spacecr TT&C Technol 33(4):354–359

    Google Scholar 

  11. Zhan YH, LIU Q, YANG D (2015) Inversion of complex refractive index for rough-surface objects. Opt Precis Eng 23(8):2178–2184

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Yonghong Zhan .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Tsinghua University Press, Beijing and Springer Nature Singapore Pte Ltd.

About this paper

Cite this paper

Zhan, Y., Yang, D., Liu, Q., Zeng, C., Wang, Y. (2018). Processing the Reflectance Data of Rough Surface for Inversing the Index of Refraction. In: Shen, R., Dong, G. (eds) Proceedings of the 28th Conference of Spacecraft TT&C Technology in China. TT&C 2016. Lecture Notes in Electrical Engineering, vol 445. Springer, Singapore. https://doi.org/10.1007/978-981-10-4837-1_29

Download citation

  • DOI: https://doi.org/10.1007/978-981-10-4837-1_29

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-4836-4

  • Online ISBN: 978-981-10-4837-1

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics