Abstract
This chapter explores the interference-based anti-reflection and light trapping methodologies for solar cell applications. When two monochromatic coherent waves having constant phase difference meet, the interference phenomena is observed. Detailed analysis of interference-based anti-reflection and principle behind the observed phenomenon has been covered. Starting from simple reflection and interference of the reflected light from single dielectric coating, the phenomenon of anti-reflection has been covered and extended to multilayer anti-reflection coating applications. The thickness and refractive index of a dielectric layers are the two most important parameters of concerns for their use as anti-reflection coatings. Correlation with reflectance minima with wavelength and dielectric layer parameters has been presented. Experimental measurements of reflectance for various suitable anti-reflection coatings have also been presented and compared with the theoretical results. At the end, benefits and limitations of dielectric-based reflectance have been discussed in context of c-Si solar cells.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Aberle AG (2001) Overview on SiN surface passivation of crystalline silicon solar cells. Sol Energy Mater Sol Cells 65:239–248. doi:10.1016/S0927-0248(00)00099-4
Choi P-H, Kim H-J, Baek D-H, Choi B-D (2012) A study on the electrical characteristic analysis of c-Si solar cell diodes. JSTS J Semicond Technol Sci 12:59–65. doi:10.5573/JSTS.2012.12.1.59
Davis KO, Jiang K, Habermann D, Schoenfeld WV (2015) Tailoring the optical properties of APCVD titanium oxide films for all-oxide multilayer antireflection coatings. IEEE J Photovolt 5:1265–1270. doi:10.1109/JPHOTOV.2015.2437272
Duttagupta S, Ma F, Hoex B et al (2012) Optimised antireflection coatings using silicon nitride on textured silicon surfaces based on measurements and multidimensional modelling. In: Energy procedia, pp 78–83
Goetzberger A, Knobloch J, Voss B (1998) Crystalline silicon solar cells. Wiley
Griffiths DJ (1999) Introduction to electrodynamics, 3rd edn.
Kumar P, Wiedmann MK, Winter CH, Avrutsky I (2009) Optical properties of Al2O3 thin films grown by atomic layer deposition. Appl Opt 48:5407. doi:10.1364/AO.48.005407
Mcintosh KR, Baker-finch SC (2012) OPAL 2.0: rapid optical simulation of practical silicon solar cells. In: 38th IEEE PVSC 265. doi:10.1109/PVSC.2012.6317616
McIntosh KR, Kho TC, Fong KC et al (2014) Quantifying the optical losses in back-contact solar cells. In: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC). IEEE, pp 0115–0123
PC1D 5.9 PC1D (ver 5.9) Software for modelling a solar cell
PVlighthouse OPAL2: Optical simulator. https://www2.pvlighthouse.com.au/calculators/OPAL2/OPAL2.aspx
Rahman MZ (2012) Modeling minority carrier’ s recombination lifetime of p-Si Solar Cell
Rahman MZ, Khan SI (2012) Advances in surface passivation of c-Si solar cells. Mater Renew Sustain Energy 1:1. doi:10.1007/s40243-012-0001-y
Richards BS (2003) Single-material TiO2 double-layer antireflection coatings. Sol Energy Mater Sol Cells 79:369–390. doi:10.1016/S0927-0248(02)00473-7
Singh HK, Arunachalam B, Kumbhar S et al (2016) Opto-electrical performance improvement of mono c-Si solar cells using dielectric–metal–dielectric (D-M-D) sandwiched structure-based plasmonic anti-reflector. Plasmonics 11:323–336. doi:10.1007/s11468-015-0049-5
Siqueiros JM, Machorro R, Regalado LE (1988) Determination of the optical constants of MgF2 and ZnS from spectrophotometric measurements and the classical oscillator method. Appl Opt 27:2549. doi:10.1364/AO.27.002549
Standard IEC 60904-3 (2008) Measurement principles for terrestrial PV solar devices with reference spectral irradiance data
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Solanki, C.S., Singh, H.K. (2017). Principle of Dielectric-Based Anti-reflection and Light Trapping. In: Anti-reflection and Light Trapping in c-Si Solar Cells. Green Energy and Technology. Springer, Singapore. https://doi.org/10.1007/978-981-10-4771-8_3
Download citation
DOI: https://doi.org/10.1007/978-981-10-4771-8_3
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-4770-1
Online ISBN: 978-981-10-4771-8
eBook Packages: EnergyEnergy (R0)