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Similarity Measurement of Gene Using Arc Tan Function in Gene Ontology

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Advances in Electronics, Communication and Computing

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 443))

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Abstract

The Gene Ontology (GO) is a technique that measures second-hand the semantic relationship of genes using an exponential and arc tan-based technique. The proposed work develops an enhanced shortest path-based measure using GO semantic relationship. The existing work presented an undeviating corridor based on an amalgam appraise of ontological match. Using GO graph and in sequence pleased are factors that improve the effectiveness of transfer functions of semantic connection of gene ontology. The semantic technique evaluates weighted paths for GO similarity measure. Other similarity measures use the shortest path in their calculation but require the specificity of a concept in hybrid measure performance of correlated genes.

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Authors and Affiliations

  1. Department of Computer Engineering, Sri Satya Sai University of Technology and Medical Science, Sehore, India

    K. Vengatesan

  2. Department of Electrical and Electronics Engineering, Marathwada Institute of Technology, Aurangabad, India

    S. B. Mahajan & R. M. Kulkarni

  3. Department of Electrical and Electronics Engineering, University of Johannesburg, Auckland Park, Johannesburg, South Africa

    P. Sanjeevikumar

  4. Department of Computer Science and Engineering, Manipal Institute of Technology, Manipal, India

    Sana Moin

Authors
  1. K. Vengatesan
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  2. S. B. Mahajan
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  3. P. Sanjeevikumar
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  4. R. M. Kulkarni
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  5. Sana Moin
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Corresponding author

Correspondence to K. Vengatesan .

Editor information

Editors and Affiliations

  1. Smart Energy Research Unit, College of Engineering and Science, Victoria University, Melbourne, VIC, Australia

    Akhtar Kalam

  2. Electronics and Communication Sciences Unit, Indian Statistical Institute, Kolkata, West Bengal, India

    Swagatam Das

  3. Department of Computer Science and Engineering, Sikkim Manipal Institute of Technology, Rangpo, Sikkim, India

    Kalpana Sharma

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Vengatesan, K., Mahajan, S.B., Sanjeevikumar, P., Kulkarni, R.M., Moin, S. (2018). Similarity Measurement of Gene Using Arc Tan Function in Gene Ontology. In: Kalam, A., Das, S., Sharma, K. (eds) Advances in Electronics, Communication and Computing. Lecture Notes in Electrical Engineering, vol 443. Springer, Singapore. https://doi.org/10.1007/978-981-10-4765-7_83

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  • DOI: https://doi.org/10.1007/978-981-10-4765-7_83

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-4764-0

  • Online ISBN: 978-981-10-4765-7

  • eBook Packages: EngineeringEngineering (R0)

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