Abstract
For a long time, the microscopist had to compromise between the lens aberrations , especially chromatic , and the electron diffusion volume to carry high resolution imaging in the SEM.
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Brodusch, N., Demers, H., Gauvin, R. (2018). Low Voltage SEM. In: Field Emission Scanning Electron Microscopy. SpringerBriefs in Applied Sciences and Technology. Springer, Singapore. https://doi.org/10.1007/978-981-10-4433-5_4
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DOI: https://doi.org/10.1007/978-981-10-4433-5_4
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