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Exploration of Machine Learning Techniques for Defect Classification

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Computing and Network Sustainability

Part of the book series: Lecture Notes in Networks and Systems ((LNNS,volume 12))

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Abstract

To develop good quality software product, there is a need of continuous defect identification and classification in each module before delivering a software product to the customer. Developing software needs proper managing of the available software resources. To deliver a software product on time, developing quality software products, Information Technology (IT) industries normally use software tools for defect detection. Based on severity, defects are detected and classified. This can be automated to reduce the development time and cost. Nowadays, machine learning algorithms have been applied by many researchers to accurately classify the defects. In this paper, a novel software defect detection and classification method is proposed and neural network models such as Probabilistic Neural Network model (PNN) and Generalized Regression Neural Network (GRNN) are integrated to identify, classify the defects from large software repository. Defects are classified into three layers based on the severity in the proposed method abstraction layer, core layer, and application layer. The performance accuracy of the proposed model is compared with MLP and J48 classifiers.

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References

  1. Shull F, Basili V, Boehm B, Brown AW, Costa P, Lindvall M, Zelkowitz M (2002) What we have learned about fighting defects. In: Proceedings eighth IEEE symposium on software metrics, pp 249–258

    Google Scholar 

  2. Menzies T, Greenwald J, Frank A (2007) Data mining static code attributes to learn defect predictors. IEEE Trans Softw Eng 33(1):2–13

    Article  Google Scholar 

  3. Denaro G (2000) Estimating software fault-proneness for tuning testing activities. In: Proceedings of the 22nd international conference on software engineering—ICSE ’00. ACM Press, New York, New York, USA, pp 704–706

    Google Scholar 

  4. Zheng J (2010) Cost-sensitive boosting neural networks for software defect prediction. Expert Syst Appl 37(6):4537–4543

    Article  Google Scholar 

  5. Lessmann S, Baesens B, Mues C, Pietsch S (2008) Benchmarking classification models for software defect prediction: a proposed framework and novel findings. IEEE Trans Softw Eng 34(4):485–496

    Article  Google Scholar 

  6. Lin S-W, Chen S-C, Wu W-J, Chen C-H (2009) Parameter determination and feature selection for back-propagation network by particle swarm optimization. Knowl Inf Syst 21(2):249–266

    Article  Google Scholar 

  7. Honar E, Jahromi M (2010) A framework for call graph construction. Student thesis at school of computer science, physics and mathematics

    Google Scholar 

  8. Kim S, Whitehead EJ Jr, Zhang Y (2008) Classifying software changes: clean or buggy? IEEE Trans Softw Eng 34(2):181–196

    Article  Google Scholar 

  9. Antoniol G, Ayari K, Penta MD, Khomh F, Guéhéneuc YG Is it a bug or an enhancement? a text-based approach to classify change requests. In: Proceedings of the 2008 conference of the center for advanced studies on collaborative research, New York, pp 304–318

    Google Scholar 

  10. Fluri B, Giger E, Gall HC (2008) Discovering patterns of change types. In: Proceedings of the 23rd international conference on automated software engineering (ASE), L’Aquila, 15–19, pp 463–466

    Google Scholar 

  11. Jalbert N, Weimer W (2008) Automated duplicate detection for bug tracking systems. In: IEEE International conference on dependable systems & networks, Anchorage, 24–27, pp 52–61

    Google Scholar 

  12. Cotroneo D, Orlando S, Russo S (2006) Failure classification and analysis of the java virtual machine. In: Proceedings of the 26th IEEE international conference on distributed computing systems, Lisboa, 4–7, pp 1–10

    Google Scholar 

  13. Guo PJ, Zimmermann T, Nagappan N, Murphy B (2010) Characterizing and predicting which bugs get fixed: an empirical study of microsoft windows. In: ACM international conference on software engineering, Cape Town, 1–8, pp 495–504

    Google Scholar 

  14. Kalinowski M (2010) Applying DPPI: A defect causal analysis approach using bayesian networks. In: Ali Babar M (ed) Product-focused software process improvement, vol 6156. Springer, Berlin, pp 92–106

    Google Scholar 

  15. Čubranić D (2004) Automatic bug triage using text categorization. In: SEKE 2004: proceedings of the sixteenth international conference on software engineering & knowledge engineering

    Google Scholar 

  16. Masters T (1995) Advanced algorithms for neural networks. Wiley, New York

    Google Scholar 

  17. Lessmann S, Baesens B, Mues C, Pietsch S (2008) Benchmarking classification models for software defect prediction: a proposed framework and novel findings. IEEE Trans Softw Eng 34(4):485–496

    Article  Google Scholar 

  18. Masters T (1995) Advanced algorithms for neural networks. Wiley, New York

    Google Scholar 

  19. Ajay Prakash BV, Ashoka DV, Manjunath Aradhya VN (2014) Application of data mining techniques for defect detection and classification. In: Proceedings of the 3rd international conference on frontiers of intelligent computing: theory and applications, vol-1. Springer, pp 387–395

    Google Scholar 

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Correspondence to B. V. Ajay Prakash .

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Ajay Prakash, B.V., Ashoka, D.V., Manjunath Aradya, V.N. (2017). Exploration of Machine Learning Techniques for Defect Classification. In: Vishwakarma, H., Akashe, S. (eds) Computing and Network Sustainability. Lecture Notes in Networks and Systems, vol 12. Springer, Singapore. https://doi.org/10.1007/978-981-10-3935-5_16

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  • DOI: https://doi.org/10.1007/978-981-10-3935-5_16

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-3934-8

  • Online ISBN: 978-981-10-3935-5

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