Abstract
A non-interferometric differential phase measuring technique is used to determine the refractive index of a medium. In total internal reflection (TIR), phase change is a function of the refractive indices of a pair of media involved. Also, the said phase change is different for p-polarized and s-polarized light components. Difference between the phases of these two polarized light components leads to the refractive index of the sample. The theory of the technique is discussed and a simple experimental method is demonstrated to determine the phase difference of the totally internally reflected p and s components.
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References
Toshiki Yasokawa et al, ‘A Method for Measuring the Three-Dimensional Refractive-Index Distribution of Single Cells Using Proximal Two-Beam Optical Tweezers and a Phase-Shifting Mach—Zehnder Interferometer’, Optical Review, Volume 14, Issue 4, pp 161–164, 2007.
J Beuthan, et al, ‘The spatial variation of the refractive index in biological cells’, Phys. Med. Biol. 41,369–382,1996.
Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, Tae Bong Eom, Jung Jin Ju, and Myoungsik Cha, ‘Measurement of refractive index and thickness of transparent plate by dual-wavelength interference’, Opt Express, OSA, Vol. 18, No. 9, 2010.
S. Patskovsky, M. Meunier, and A. V. Kabashin, ‘Phase-sensitive silicon-based total internal reflection sensor’, Optics Express, Vol. 15, No. 19,2007.
Muhammad Kashif, Ahmad Ashrif A. Bakar*, Norhana Arsad and Sahbudin Shaari, ‘Development of Phase Detection Schemes Based on Surface Plasmon Resonance Using Interferometry’, Sensors, 14(9), 15,914–15,938, 2014.
William M. Ash III and Myung K Kim, ‘Digital Holography of total internal reflection’, Opt Express, OSA, Vol. 16, No. 13,2008.
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Das, T., Roy, S. (2017). Differential Phase Imaging of Evanescent Wave in Total Internal Reflection for Determining Refractive Index. In: Bhattacharya, I., Chakrabarti, S., Reehal, H., Lakshminarayanan, V. (eds) Advances in Optical Science and Engineering. Springer Proceedings in Physics, vol 194. Springer, Singapore. https://doi.org/10.1007/978-981-10-3908-9_30
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DOI: https://doi.org/10.1007/978-981-10-3908-9_30
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