Abstract
Silicon-on-insulator (SOI) suffers with various drawbacks so Silicon-on-nothing (SON) has been the researchers recent target. The result shows that surface potential and electric field is maximum compare to Single Material Gate as well as Dual Material Gate SOI junctionless Transistor (DMG SOI JLT). Various targeted features comprise such as maximum on-state current, improved transconductance Gm, Gm/IDS and reduced drain induced barrier lowering. In this paper is the work on the parametric effect of two layer gate stack (DGS) (High dielectric/Sio2) on the Dual Material Gate (DMG) for SON Junctionless Transistor. The results obtained by the simulation for 40 nm channel length with work function as 4.77 and 4.1 eV with doping concentration (0.4 × 1018 cm−3).
Y.V. Chavan—Sr IEEE-Member
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Wagaj, S.C., Chavan, Y.V. (2016). Nano Scale Dual Material Gate Silicon on Nothing Junctionless MOSFET for Improving Short Channel Effect and Analog Performance. In: Unal, A., Nayak, M., Mishra, D.K., Singh, D., Joshi, A. (eds) Smart Trends in Information Technology and Computer Communications. SmartCom 2016. Communications in Computer and Information Science, vol 628. Springer, Singapore. https://doi.org/10.1007/978-981-10-3433-6_4
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DOI: https://doi.org/10.1007/978-981-10-3433-6_4
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