Abstract
This chapter discusses the impact of process variation on the voltage-controlled oscillator performance degradation. Mixed-mode device and circuit simulation is used to probe the physical insight. Analytical equations are dervied to provide the theoretical basis. Monte Carlo simulation results are shown to demonstrate the statistical variation of VCO performance subjected to process variation. Substrate bias technique helps reduce the process variation effect on VCO performance fluctuation.
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Yuan, JS. (2016). Oscillator Design for Variability. In: CMOS RF Circuit Design for Reliability and Variability. SpringerBriefs in Applied Sciences and Technology(). Springer, Singapore. https://doi.org/10.1007/978-981-10-0884-9_9
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DOI: https://doi.org/10.1007/978-981-10-0884-9_9
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Publisher Name: Springer, Singapore
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Online ISBN: 978-981-10-0884-9
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