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LNA Design for Variability

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CMOS RF Circuit Design for Reliability and Variability

Part of the book series: SpringerBriefs in Applied Sciences and Technology ((SBR))

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Abstract

This chapter discusses the low-noise amplifier process variation effect. Extensive analytical equations are derived. The adaptive substrate bias technique to reduce the process variation effect on the low-noise amplifier is presented.

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References

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Correspondence to Jiann-Shiun Yuan .

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Yuan, JS. (2016). LNA Design for Variability. In: CMOS RF Circuit Design for Reliability and Variability. SpringerBriefs in Applied Sciences and Technology(). Springer, Singapore. https://doi.org/10.1007/978-981-10-0884-9_7

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  • DOI: https://doi.org/10.1007/978-981-10-0884-9_7

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-0882-5

  • Online ISBN: 978-981-10-0884-9

  • eBook Packages: EngineeringEngineering (R0)

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