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Voltage-Controlled Oscillator Reliability

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CMOS RF Circuit Design for Reliability and Variability

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Abstract

This chapter talks about the LC oscillator reliability subjected to electrical stress. Mixed-mode device and circuit simulation results as well as experimental data of voltage-controlled LC oscillators are presented.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, University of Central Florida, Orlando, 32816, FL, USA

    Jiann-Shiun Yuan

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  1. Jiann-Shiun Yuan
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Correspondence to Jiann-Shiun Yuan .

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Yuan, JS. (2016). Voltage-Controlled Oscillator Reliability. In: CMOS RF Circuit Design for Reliability and Variability. SpringerBriefs in Applied Sciences and Technology(). Springer, Singapore. https://doi.org/10.1007/978-981-10-0884-9_5

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  • DOI: https://doi.org/10.1007/978-981-10-0884-9_5

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-0882-5

  • Online ISBN: 978-981-10-0884-9

  • eBook Packages: EngineeringEngineering (R0)

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