Abstract
In this paper, we present a refinement method of static analysis based on path segment. The dataflow analysis generates the initial defect detection results and the defect path. Then the path constraints that might cause the defect are searched for on the defect path for a reported defect. Finally, all the path constraints are solved by a constraint solver. If no solution is found, the defect is a false positive, otherwise not. The comparative experiment on an embedded software of certain key field and the comparisons with similar tool PC-Lint show that our method has better analytical accuracy and efficiency.
Supported by Foundation for Talents of Beijing Jiaotong University (Grant No. O14RC00010).
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Wu, T., Zhang, J., Zhang, D., Jin, D. (2015). Static Analysis Refinement on Defect Path Segment. In: Zhang, X., Wu, Z., Sha, X. (eds) Embedded System Technology. ESTC 2015. Communications in Computer and Information Science, vol 572. Springer, Singapore. https://doi.org/10.1007/978-981-10-0421-6_5
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DOI: https://doi.org/10.1007/978-981-10-0421-6_5
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