Abstract
The optical band gap and carbon clusters behavior as a function of ion dose are examined for 40 keV boron, helium, and xenon ion-implanted polymethylmethacrylate (PMMA) at the same ion doses of 3.13 × 1015, 6.25 × 1015, 1.25 × 1016, and 2.5 × 1016 ions/cm2. The values of E g opt and N ion are compared and analyzed. The effect of the ion mass on the carbonization processes in PMMA nanocomposite films formed by implantation of these ions as revealed from optical absorption measurements is considered.
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Acknowledgments
T.S. Kavetskyy acknowledges the Ministry of Education and Science of Ukraine (project No. 0116U004737). A.L. Stepanov thanks for the financial support from the Russian Foundation for Basic Research (project No. 15-48-02525).
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Trzciński, M., Kavetskyy, T.S., Stepanov, A.L. (2018). Optical Band Gap and Carbon Clusters in PMMA Nanocomposite Films Formed by Ion Implantation: Boron, Helium, and Xenon Ions. In: Petkov, P., Tsiulyanu, D., Popov, C., Kulisch, W. (eds) Advanced Nanotechnologies for Detection and Defence against CBRN Agents. NATO Science for Peace and Security Series B: Physics and Biophysics. Springer, Dordrecht. https://doi.org/10.1007/978-94-024-1298-7_7
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DOI: https://doi.org/10.1007/978-94-024-1298-7_7
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