Skip to main content

CMOS Image Sensor for Smart Cameras

  • Chapter
  • First Online:
  • 2112 Accesses

Part of the book series: KAIST Research Series ((KAISTRS))

Abstract

A smart camera is a vision system with special features implemented to achieve its specific purpose. A smart camera which can be used for security or surveillance purpose requires high dynamic range of the sensor to cover broad illumination range of the scene. A stick- or badge-type smart camera operates as a stand-alone device so that the power consumption is one of the most important parameters. For applications such as nondestructive inspection using infrared (IR), sensitivity of the image sensors should be improved to obtain suitable SNR for reliable output. This chapter describes basic imaging principles and dynamic range expansion methods of the CMOS image sensors.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD   109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

References

  1. Hynecek J (2002) High dynamic range active pixel CMOS image sensor and data processing system incorporating adaptive pixel reset, U.S. Patent, 0113886 A1

    Google Scholar 

  2. Meynants G, Dierickx B, Scheffer D (1998) CMOS active pixel image sensor with CCD performance. Proc SPIE 3410:68–76

    Article  Google Scholar 

  3. Mendis SK, Kemeny SE, Gee RC, Pain B, Staller CO, Kim Q, Fossum ER (1997) CMOS Active pixel image sensors for highly integrated imaging systems. IEEE J Solid-State Circuits 32(2):187–197

    Article  Google Scholar 

  4. Yasuda T, Hamamoto T, Aizawa K (2003) Adaptive-integration-time image sensor with real-time reconstruction function. IEEE Trans Electron Devices 50(1):111–120

    Article  Google Scholar 

  5. Theuwissen AJP (1995) Solid-State Imaging with Charge-Coupled Devices. Kluwer Academic Publishers, Dordrecht

    Google Scholar 

  6. Hardy T, Murowinski R, Deen MJ (1998) Charge transfer efficiency in proton damaged CCD’s. IEEE Trans Nuclear Sci 45(2):154–163

    Article  Google Scholar 

  7. Yonemoto K, Sumi H (2000) A CMOS image sensor with a simple fixed-pattern-noise-reduction technology and a hole accumulation diode. IEEE J Solid-State Circuits 35(12):2038–2043

    Article  Google Scholar 

  8. Hynecek J (2002) CDS noise reduction of partially reset charge-detection nodes. IEEE Trans Circuits Syst 49(3):276–280

    Article  Google Scholar 

  9. Tian H, Gamal AE (2001) Analysis of 1/f noise in switched MOSFET circuits. IEEE Trans Circuits Syst 48(2):151–157

    Article  MATH  Google Scholar 

  10. Kawai N, Kawahito S (2004) Noise Analysis of high-gain, low-noise column readout circuits for CMOS image sensors. IEEE Trans Electron Devices 51(2):185–194

    Article  Google Scholar 

  11. Furumiya M, Ohkubo H, Muramatsu Y, Kurosawa S, Okamoto F, Fujimoto Y, Nakashiba Y (2001) High-sensitivity and no-crosstalk pixel technology for embedded CMOS image sensor. IEEE Trans Electron Devices 48(10):2221–2227

    Article  Google Scholar 

  12. Tian H, Fowler B, Gamal AE (1999) Analysis of temporal noise in CMOS APS. Proceedings of SPIE, vol 3649. San Jose, pp 177–185

    Google Scholar 

  13. Tian H, Fowler B, Gamal AE (2001) Analysis of temporal noise in CMOS photodiode active pixel sensor. IEEE J Solid-State Circuits 36(1):92–101

    Article  Google Scholar 

  14. Rodericks B, Hoffberg M (2002) Wide dynamic range digital imaging system and method. PCT Patent, WO 02/103391 A1

    Google Scholar 

  15. Kavadias S, Dierickx B, Scheffer D, Alaerts A, Uwaerts D, Bogaerts J (2000) A logarithmic response CMOS image sensor with on-chip calibration. IEEE J Solid-State Circuits 35(8):1146–1152

    Article  Google Scholar 

  16. Takanayagi I (2006) Wide dynamic range linear-and-log active pixel. U.S. Patent, 0036785

    Google Scholar 

  17. Hara K, Kubo H, Kimura M, Murao F, Komon S (2005) A Linear-logarithmic cmos sensor with offset calibration using an injected charge signal. In: Proceedings of ISSCC, pp 354--603

    Google Scholar 

  18. Decker S, McGrath RD, Brehmer K, Sodini CG (1998) A 256 × 256 CMOS Imaging array with wide dynamic range pixels and column-parallel digital output. IEEE J Solid-State Circuits 33:2081–2091

    Article  Google Scholar 

  19. Sugawa S, Akahane N, Adachi S, Mori K, Ishiuchi T, Mizobuchi K (2005) A 100 dB dynamic range CMOS Image sensor using a lateral overflow integration capacitor. In: Proceedings of ISSCC, pp 352--353

    Google Scholar 

  20. Yadid-Pecht O, Fossum ER (1997) Wide intrascene dynamic range CMOS APS using dual sampling. IEEE Trans Electron Devices 44(10):1721–1723

    Article  Google Scholar 

  21. Nakamura J (2002) Wide dynamic range pinned photodiode active pixel sensor (APS), U.S. Patent, 0096124 A1

    Google Scholar 

  22. Mase M, Kawahito S, Sasaki M, Wakamori Y, Furuta M (2005) A Wide dynamic range CMOS image sensor with multiple exposure-time signal outputs and 12-bit column-parallel cyclic A/D converters. IEEE J Solid-State Circuits 40(12):2787–2795

    Article  Google Scholar 

  23. Park JH, Mase M, Kawahito S, Sasaki M, Wakamori Y, Ohta Y (2005) A 142 dB dynamic range CMOS image sensor with multiple exposure time signals. In: Proceedings of ASSCC, Taiwan, vol A2L-3, pp 85–88

    Google Scholar 

Download references

Acknowledgments

This work was supported by the Center for Integrated Smart Sensors funded by the Ministry of Science, ICT & Future Planning as Global Frontier Project. (CISS-3-4)

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to JongHo Park .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2016 Springer Science+Business Media Dordrecht

About this chapter

Cite this chapter

Park, J. (2016). CMOS Image Sensor for Smart Cameras. In: Kyung, CM. (eds) Theory and Applications of Smart Cameras. KAIST Research Series. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-9987-4_1

Download citation

  • DOI: https://doi.org/10.1007/978-94-017-9987-4_1

  • Published:

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-017-9986-7

  • Online ISBN: 978-94-017-9987-4

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics