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Stress Measurements and Optical Studies of (AsSe)100−xAgx Films for Optical Sensor Applications

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Nanoscience Advances in CBRN Agents Detection, Information and Energy Security

Abstract

Thin (AsSe)100–xAgx (x = 0–25 mol.%) films have been deposited on glass substrates and silicon cantilevers by vacuum thermal evaporation from the corresponding bulk materials. The mechanical stability was investigated by measuring the stress of the films deposited on silicon cantilevers. The correlation between the stress and the composition has been investigated and will be discussed.

In order to investigate photoinduced changes in the refractive index, the films have been exposed to a He-Ne laser. The transmission spectra of the films have been measured before and after laser illumination; the refractive index has been derived by Swanepoel method. The photoinduced changes occurring in the films after illumination lead to changes of the optical constants. These features make the investigated materials suitable for application in planar chalcogenide-based sensor devices.

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Authors and Affiliations

  1. Institute of Electrochemistry and Energy Systems, Bulgarian Academy of Sciences, Acad. G. Bonchev Bl.10, 1113, Sofia, Bulgaria

    V. Ilcheva, V. Boev, O. Koleva & T. Petkova

  2. Institute of Nanostructure Technologies and Analytics (INA), University of Kassel, Heinrich-Plett-Str. 40, 34132, Kassel, Germany

    E. Petkov & C. Popov

  3. Department of Physics, University of Chemical Technology and Metallurgy, 8 “Kl. Ohridski” blvd., 1756, Sofia, Bulgaria

    P. Petkov

  4. Foundation for Research and Technology Hellas FORTH/ICE-HT, Institute of Chemical Engineering and High Temperature Chemical Processes, 1414, GR-26 504, Patras, Greece

    O. Koleva & S. N. Yannopoulos

Authors
  1. V. Ilcheva
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  2. E. Petkov
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  3. C. Popov
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  4. V. Boev
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  5. O. Koleva
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  6. P. Petkov
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  7. T. Petkova
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  8. S. N. Yannopoulos
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Corresponding author

Correspondence to V. Ilcheva .

Editor information

Editors and Affiliations

  1. Department of Physics, University of Chemical Technology and Metallurgy, Sofia, Bulgaria

    Plamen Petkov

  2. Department of Physics, Technical University of Moldova, Chisinau, Moldova

    Dumitru Tsiulyanu

  3. Dept. of Mathematics and Natural Sciences, University of Kassel, Kassel, Germany

    Wilhelm Kulisch

  4. Inst. of Nanostructure Technologies and Analytics, University of Kassel, Kassel, Germany

    Cyril Popov

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Ilcheva, V. et al. (2015). Stress Measurements and Optical Studies of (AsSe)100−xAgx Films for Optical Sensor Applications. In: Petkov, P., Tsiulyanu, D., Kulisch, W., Popov, C. (eds) Nanoscience Advances in CBRN Agents Detection, Information and Energy Security. NATO Science for Peace and Security Series A: Chemistry and Biology. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-9697-2_31

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