Abstract
Several current interesting optical coatings are introduced. Coatings with reflectance greater than 100 % have been realized by using gain layer with negative extinction coefficient. A useful coating area of filters for DWDM has been enlarged with the uniformity better than ±0.003 % over an area of 50 mm in diameter and better than ±0.0006 % over a 20 mm in diameter by using etching technique on the depositing layers with oxygen ion and shaping tooling factor technique. Antireflection coatings with characteristics of hydrophobic, hydrophilic, residual color to decorate solar cells and blackness has been utilized in design and fabricated. The advantages of coatings with negative refractive index layer have been illustrated. Five advanced monitoring methods to achieve the coating as the design have been proposed and proved better than conventional methods.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Y.-J. Chen, C.-C. Lee, S.-H. Chen, F. Flory, Extra-high reflection coating with negative extinction coefficient. Opt. Lett. 38, 3377–3379 (2013)
H.A. Macleod, Thin-Film optical Filter, 4th ed (CRC Press, New York, 2010)
H.A. Macleod, Gain optical coatings: part 1. Bull. Soc. Vac. Coaters Issue Fall, 22–27 (2011)
A.J. Nozik, Quantum dot solar cells. Phys. E 14, 115–120 (2002)
Prashant.V. Kamat, Quantum dot solar cells. Semiconductor nanocrystals as light harvesters. J. Phys. Chem. C 112(48), 18737–18753 (2008)
H.-J. Lin, S. Vedraine, J. Le-Rouzo, S.-H. Chen, F. Flory, C.-C. Lee, Optical properties of quantum dots layers: application to photovoltaic solar cells. Sol. Energy Mater. Sol. Cells 117, 625–656 (2013)
J. Wu, Z.M. Wang (eds.), Quantum Dot Solar Cells (Springer, New York, 2014)
J. Zhao, J.A. Bardecker, A.M. Munro, M.S. Liu, Y. Niu, I.-K. Ding, J. Luo, B. Chen, A.K.-Y. Jen, D.S. Ginger, Efficient CdSe/CdS quantum dot light-emitting diodes using a thermally polymerized hole transport layer. Nano Lett. 6(3), 463–467 (2006)
H. Liu, T. Wang, Q. Jiang, R. Hogg, F. Tutu, F. Pozzi, A. Seeds, Long-wavelength InAs/GaAs quantum-dot laser diode monolithically grown on Ge substrate. Nat. Photonics 5, 416–419 (2011)
T.-H. Kim, K.-S. Cho, E.K. Lee, S.J. Lee, J. Chae, J.W. Kim, D.H. Kim, J.-Y. Kwon, G. Amaratunga, S.Y. Lee, B.L. Choi, Y. Kuk, J.M. Kim, K. Kim, Full-colour quantum dot displays fabricated by transfer printing. Nat. Photonics 5, 176–182 (2011)
S. Jin, Y. Hu, Z. Gu, L. Liu, H.-C. Wu, Application of quantum dots in biological imaging. J. Nanomaterials 2011(834139) (2011). doi:10.1155/2011/834139
A. Fang, T. Koschny, M. Wegener, C.M. Soukoulis, Self-consistent calculation of metamaterials with gain. Phys. Rev. B 79, 241104(R) (2009)
S.M. Xiao, V.P. Drachev, A.V. Kildishev, X.J. Ni, U.K. Chettiar, H.K. Yuan, V.M. Shalaev, Loss-free and active optical negative-index metamaterials. Nature 466, 735–740 (2010)
M. Decker, I. Staude, I.I. Shishkin, K.B. Samusev, P. Parkinson, V.K.A. Sreenivasan, A. Minovich, A.E. Miroshnichenko, A. Zvyagin, C. Jagadish, D.N. Neshev, Y.S. Kivshar, Dual-channel spontaneous emission of quantum dots in magnetic metamaterials. Nat. Commun. 4(2949) (2013). doi:10.1038/ncomms3949
L. Ivan Epstein, The design of optical filter. J. Opt. Soc. Am. 42, 806–810 (1952)
C.-C. Lee, Thin Film Optics and Coating Technology, 7th edn. (Yi Hsien, Taipei, 2012)
H. Angus Macleod, Turning value monitoring of narrow-band all-dielectric thin-film optical filters. Optica Acta 19, 1–28 (1972)
H.A. Macleod, Monitoring of optical coatings. Appl. Opt. 20, 82–89 (1981)
C.-C. Lee, W. Kai, C.-C. Kuo, S.-H. Chen, Improvement of the optical coating process by cutting layers with sensitive monitor wavelengths. Opt. Express 13, 4854–4861 (2005)
C.-C. Lee, W. Kai, In situ sensitive optical monitoring with error compensation. Opt. Lett. 32(15), 2118–2120 (2007)
C.-C. Lee, S.-H. Chen, C.-C. Kuo, Fabrication of DWDM filters with large useful area. SPIE Optics and Photonics, paper #6286-15, San Diego, USA, 13–17 Aug 2006
C.-C. Lee, S.-H. Chen, C.-C. Kuo, C.-Y. Wei, Achievement of an arbitrary bandwidth for a narrow bandpass filter. Opt. Express 15, 15228–15233 (2007)
C.-C. Lee, Optical interference coatings for optics and photonics (Invited). Appl. Opt. 52, 73–81 (2013)
S.R. Kennedy, M.J. Brett, Porous broadband antireflection coating by glancing angle deposition. Appl. Opt. 42, 4573–4579 (2003)
Y.F. Huang, S. Chattopadhyay, Y.J. Jen, C.Y. Peng, T.A. Liu, Y.K. Hsu, C.L. Pan, H.C. Lo, C.H. Hsu, Y.H. Chang, C.S. Lee, K.H. Chen, L.-C. Chen, Improved broadband and quasiomnidirectional anti-reflection properties with biomimetic silicon nanostructures. Nat. Nanotechnol. 2, 770–774 (2007)
U. Schulz, C. Präfke, C. Gödeker, N. Kaiser, A. Tünnermann, Plasma-etched organic layers for antireflection purposes. Appl. Opt. 50, C31–C35 (2011)
B. Päivänranta, T. Saastamoinen, M. Kuittinen, A wide-angle antireflection surface for the visible spectrum. Nanotechnology 20, 375301 (2009)
J.-Q. Xi, M.F. Schubert, J.K. Kim, E.F. Schubert, M. Chen, S.-Y. Lin, W. Liu, J.A. Smart, Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection. Nat. Photonics 1, 176–179 (2007)
J.-L. Tsai, Applications of negative refraction index materials for antireflection and narrow band pass filters. MS Thesis, Department of Optics and Photonics, National Central University, Taiwan, 2009
H. Ishikawa, B. Lippey, in Two layer broad band AR coating. Proceedings of 10th International Conference on Vacuum Web Coating (Bakish Materials Corporation, 1996), pp. 221–233
G. McHale, N.J. Shirtcliffe, M.I. Newton, Contact-angle hysteresis on super-hydrophobic surfaces. Langmuir 20, 10146–10149 (2004)
L. Mascia, T. Tang, Polyperfluoroether-silica hybrids. Polymer 39, 3045–3057 (1998)
K.C. Camargo, A.F. Michels, F.S. Rodembusch, M.F. Kuhn, F. Horowitz, Visibly transparent and near infrared, wideangle, anti-reflection coatings with simultaneous selfcleaning on glass. Opt. Mater. Express 2, 969–977 (2012)
M. Flemming, A. Duparre, Design and characterization of nanostructured ultrahydrophobic coatings. Appl. Opt. 45, 1397–1401 (2006)
K. Zhang, F. Zhu, C.H.A. Huan, A.T.S. Wee, Indium tin oxide films prepared by radio frequency magnetron sputtering method at a low processing temperature. Thin Solid Films 376, 255–263 (2000)
B. Vidal, A. Fornier, E. Pelletier, Wideband optical monitoring of nonquarter wave multilayer filter. Appl. Opt. 18, 3851–3856 (1979)
F. Zhao, Monitoring of periodic multilayer by the level method. Appl. Opt. 24, 3339–3343 (1985)
C.J. van der Laan, Optical monitoring of nonquarterwave stacks. Appl. Opt. 25, 753–760 (1986)
B. Bobbs, J.E. Rudisill, Optical monitoring of nonquarterwave film thickness using a turning point method. Appl. Opt. 26, 3136–3139 (1987)
C. Zang, Y. Wang, W. Lu, A single-wavelength monitoring method for optical thin-film coatings. Opt. Eng. 43, 1439–1443 (2004)
A.V. Tikhonravov, M.K. Trubetskov, Eliminating of cumulative effect of thickness errors in monochromatic monitoring of optical coating production: theory. Appl. Opt. 46, 2084–2090 (2007)
J. Lee, R.W. Collins, Real-time characterization of film growth on transparent substrates by rotating-compensator multichannel ellipsometry. Appl. Opt. 37, 4230–4238 (1998)
S. Dligatch, R. Netterfield, B. Martin, Application of in-situ ellipsometry to the fabrication of multi-layered coatings with sub-nanometre accuracy. Thin Solid Films 455–456, 376–379 (2004)
C.C. Lee, K. Wu, S.H. Chen, S.J. Ma, Optical monitoring and real time admittance loci calculation through polarization interferometer. Opt. Exp. 15, 17536–17541 (2007)
B. Kimbrough, J. Millerd, J. Wyant, J. Hayes, Low coherence vibration insensitive Fizeau interferometer. Proc. SPIE 6292, 62920F (2006)
Y.R. Chen, Monitoring of film growth by admittance diagram. Master Thesis, National Central University, Taiwan, 2004
B.J. Chun, C.K. Hwangbo, J.S. Kim, Optical monitoring of nonquarterwave layers of dielectric multilayer filters using optical admittance. Opt. Express 14, 2473–2480 (2006)
C.-C. Lee, Y.J. Chen, Multilayer coatings monitoring using admittance diagram. Opt. Express 16(9), 6119–6124 (2008)
S. Wilbrandt, N. Kaiser, O. Stenzel, In-situ broadband monitoring of heterogeneous optical coatings. Thin Solid Films 502, 153–157 (2005)
B. Badoil, F. Lemarchand, M. Cathelinaud, M. Lequime, Interest of broadband optical monitoring for thin-film filter manufacturing. Appl. Opt. 46, 4294–4303 (2007)
W. Kai, C.-C. Lee, T.-L. Ni, Advanced broadband monitoring for thin film deposition through equivalent optical admittance loci observation. Opt. Express 20, 3883–3889 (2012)
C.C. Lee, K. Wu, T.L. Ni, Optical Admittance Loci Monitoring for Thin Film Deposition (Lambert Academic, Saarbrücken, 2012) (ISBN 978-3-659-00198-7)
C.-C. Lee, W. Kai, M.-Y. Ho, Reflection coefficient monitoring for optical interference coating depositions. Opt. Lett. 38, 1325–1327 (2013)
A.V. Tikhonravov, T.V. Amotchkina, in Optical Thin Film and Coatings, ed. by A. Piegariand, F. Flory. Optical monitoring strategies for optical coating manufacturing, Chap. 3 (Woodhead, Cambridge, 2013). (ISBN 978-0-85709-594-7) (2013)
F. Flory, Y.J. Chen, C.C. Lee, L. Escoubas, J.J. Simon, P. Torchio, J. Le Rouzo, Optical properties of dielectric thin films including quantum dots. Appl. Opt. 50, C129–C134 (2011)
F. Flory, L. Escoubas, G. Berginc, optical properties of nanostructured materials a review. Nanophotonics 5(1), 052502 (2011). doi:10.1117/1.3609266
A. Sytchkova, in Optical Thin Film and Coatings, ed. by A. Piegariand, F. Flory. Complex materials with plasmonic effects for optical thin film application, Chap. 5 and F. Flory, Y.J. Chen, H.L. Lin, Optical thin films containing quantum dots, Chap. 12 (Woodhead, Cambridge, 2013). (ISBN 978-0-85709-594-7)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2015 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Lee, CC. (2015). Thin Film Optical Coatings. In: Lee, CC. (eds) The Current Trends of Optics and Photonics. Topics in Applied Physics, vol 129. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-9392-6_1
Download citation
DOI: https://doi.org/10.1007/978-94-017-9392-6_1
Published:
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-017-9391-9
Online ISBN: 978-94-017-9392-6
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)