Abstract
The evaluation of measurement uncertainty is a main task in measurement, as we have amply discussed in Chap. 2, and one of the main aims of this book is to provide a sound foundation for that. We have already taken some steps in this direction: in Chap. 5, we have presented a general probabilistic model of the measurement process which provides the basic theoretical framework for the evaluation. In Chap. 6, we have started to consider the application of that framework, discussing the logical steps involved, by means of simple illustrative examples.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
This and the following two sections are amply based on Ref. [2], to which the reader is referred for additional details.
- 2.
For understanding this result without performing analytical calculation, consider the following geometrical argument. Multiplying the argument of a function by a constant factor \(k\) is equivalent to scaling the function along the abscissa by the same factor. For example, if \(k>1\), the result is a contraction of the graph of the function. The integration is equivalent to calculating the area under the graph, which, after contraction, is reduced by the factor \(k\). To restore a unit area, it is thus necessary to further multiply by \(k\). A similar argument holds true for \(k<1\), which corresponds to a dilation.
- 3.
Numerical values are assumed to be expressed in arbitrary consistent units.
- 4.
Hysteresis occurs when the behaviour of a system depends on its past environment. This happens because the system can be in more than one internal state. Prediction of its future development would require knowledge either of its internal state or of its history. In typical measurement conditions, such a prediction is impossible and thus hysteresis constitutes a source of uncertainty.
- 5.
- 6.
Legal metrology will be briefly addressed in Chap. 11.
- 7.
- 8.
The term \(\mathbf{a}\cdot \mathbf{v}^{T}\) is the scalar product of \(\mathbf{a}\) times \(\mathbf{v}\) and the operator \(T\) superscript denotes transposition.
References
Cox, MG., Harris, P.M.: SSfM best practice guide No. 6, uncertainty evaluation. Technical Report DEM-ES-011, National Physical Laboratory, Teddington, Middlesex, UK, (2006)
Cox, M.G., Rossi, G.B., Harris, P.M., Forbes, A.: A probabilistic approach to the analysis of measurement processes. Metrologia 45, 493–502 (2008)
Rossi, G.B., Crenna, F., Codda, M.: Metrology software for the expression of measurement results by direct calculation of probability distributions. In: Ciarlini, P., Cox, M.G., Pavese, F., Richter, D., Rossi, G.B. (eds.) Advanced Mathematical Tools in Metrology VI. World Scientific, Singapore (2004)
Rossi, G.B., Crenna, F., Cox, M.G., Harris, P.M.: Combining direct calculation and the Monte Carlo Method for the probabilistic expression of measurement results. In: Ciarlini, P., Filipe, E., Forbes, A.B., Pavese, F., Richter, D. (eds.) Advanced Mathematical and Computational Tools in Metrology VII. World Scientific, Singapore (2006)
BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML.: Guide to the expression of uncertainty in measurement. ISO, Geneva, Switzerland. Corrected and reprinted 1995, (1993). ISBN 92-67-10188-9
Press, S.J.: Bayesian statistics. Wiley, New York (1989)
Gill, J.: Bayesian methods. Chapman and Hall/CRC, Boca Raton (2002)
Lira, I.: Bayesian assessment of uncertainty in metrology. Metrologia 47, R1–R14 (2010)
Wong, P.W.: Quantization noise, fixed-point multiplicative round off noise, and dithering. IEEE Trans. Acoust. Speech Sig. Proc. 38, 286–300 (1990)
Michelini RC, Rossi GB (1996) Assessing measurement uncertainty in quality engineering. In: Proceedings of the IMTC/96-IMEKO TC 7: Instrumentation and Measurement Technology Conference, Brussels, 4–6, 1996, p 1217–1221
Lira, I.H.: The evaluation of standard uncertainty in the presence of limited resolution of indicating devices. Meas. Sci. Technol. 8, 441–443 (1997)
Bentley, J.P.: Principles of Measurement Systems, 4th edn. Pearson Education Ltd., Harlow (2005)
Morris, A.S., Langari, R.: Measurement and Instrumentation. Academic Press/Elsevier, Waltham (2012)
BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML: Guide to the expression of uncertainty in measurement (GUM)-Supplement 1: Propagation of distributions using a Monte Carlo method. International Organization for Standardization, Geneva (2006)
Pavese, F., Forbes, A. (eds.): Data Modeling for Metrology and Testing in Measurement Science. Birkhauser-Springer, Boston (2009)
Greif, N., Richter, D.: Software validation and preventive software quality assurance. In: Pavese, F., Forbes, A. (eds.) Data Modeling for Metrology and Testing in Measurement Science, pp. 371–412. Birkhauser-Springer, Boston (2009)
ISO: ISO/IEC 17025: General requirements for the competence of testing and calibration laboratories. ISO, Geneve (1999)
Wichmann B, Parkin G, Barker R (2007) Validation of software in measurement systems, Software support for metrology, Best practice guide 1, NPL Report DEM-ES 014, January 2007
Steele, A.G., Douglas, R.J.: Monte Carlo Modeling of Randomness. In: Pavese, F., Forbes, A. (eds.) Data Modeling for Metrology and Testing in Measurement Science, pp. 329–370. Birkhauser-Springer, Boston (2009)
Gentle, J.E.: Computational statistics. Springer, New York (2009)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2014 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Rossi, G.B. (2014). The Evaluation of Measurement Uncertainty. In: Measurement and Probability. Springer Series in Measurement Science and Technology. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-8825-0_9
Download citation
DOI: https://doi.org/10.1007/978-94-017-8825-0_9
Published:
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-017-8824-3
Online ISBN: 978-94-017-8825-0
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)