Abstract
Can the intensity fluctuations generated while a wave is impinging on an edge really be explained by Huygens’ principle? Do rotational-symmetric magnetic fields really possess lens properties for electrons? How can the equations for the calculation of distances and angles between diffraction reflections be deduced in the case of a non-cubic lattice? How can the efficiency of an energy dispersive X-ray detector be calculated? How does an electron prism work? We would like to answer these and similar questions in this chapter. In doing so, it is necessary that the mathematics plays a much more important role than in the chapters before. In some cases we have written little computer programs to get quantitative results using our simplified models.
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Notes
- 1.
Augustin Jean Fresnel, French physicist, 1788–1827.
- 2.
Pierre-Simon Laplace, French mathematician, 1749–1827.
- 3.
Walter Glaser, Austrian physicist and electron optician, 1906–1960.
- 4.
Paul Peter Ewald, German physicist, 1888–1985.
- 5.
Peter Debye, Dutch physicist, 1884–1966, Nobel prize in chemistry in 1936.
- 6.
Pierre Victor Auger, French physicist, 1899–1993.
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Thomas, J., Gemming, T. (2014). Basics Explained in More Detail (with a Bit More Mathematics). In: Analytical Transmission Electron Microscopy. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-8601-0_10
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