Abstract
Fluctuation phenomena with 1/f spectrum have been observed in a wide variety of dissimilar physical systems, where f is frequency. Noise experiments in electronic devices reveal the fractional power spectrum of 1/f α type. It is known that noise currents in semiconductors and turbulent flow fields are described by fractional power spectra of 1/f 3/2 and 1/f 5/3 types. We have shown that the acceleration spectrum is characterized by a fractional power in §3, the dynamical process of random activation of fault patches is now examined in relation to 1/f α fluctuations.
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© 1997 Springer Science+Business Media Dordrecht
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Koyama, J. (1997). Stochastic Rupture Process of Fault Patches. In: The Complex Faulting Process of Earthquakes. Modern Approaches in Geophysics, vol 16. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-3261-1_7
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DOI: https://doi.org/10.1007/978-94-017-3261-1_7
Publisher Name: Springer, Dordrecht
Print ISBN: 978-90-481-4829-5
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