Abstract
At our faculty the students have to follow an extensive (mixed-signal) ASIC design course in the third year of the program. In [1] we have presented an overview of the whole course, but in the meanwhile we have extended the mixed-signal test part of this ASIC design course considerably. In our course the students have to design and test a so-called dial-memo IC (see Figure 1).
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References
[1] The mixed-signal asic design course at Twente
R.J.W.T. Tangelder, S.H. Gerez, H.G. Kerkhoff, E.A.M. Klumperink, J. Smit, H. Snijders, H. Speek, H. de Vries
2nd European Workshop on Microelectronics Education, (c) Kluwer Academic Publishers
Noordwijkerhout, The Netherlands, May 14–15 1998, pp. 169–172
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© 2000 Springer Science+Business Media Dordrecht
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Tangelder, R.J.W.T. et al. (2000). Mixed-Signal Testing at the ASIC Design Course at Twente University. In: Courtois, B., Guillemot, N., Kamarinos, G., Stéhelin, G. (eds) Microelectronics Education. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-9506-3_47
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DOI: https://doi.org/10.1007/978-94-015-9506-3_47
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