Abstract
Convergent beam electron diffraction (CBED) is fairly recent as a standard technique in commercial electron microscopes. It was invented already in 1939 by Möllenstedt [1]; applications in crystallography were proposed by MacGillavry [2] and Ackerman [3] in the 1940’s. In the mid 1960’s Goodman and Lehmpfuhl [4] revived CBED as an alternative to SAD spot patterns, which they saw as poor substitutes for integrated intensities as used in X-ray crystallography. They turned to the Kossel-Möllenstedt or CBED patterns as a way of recording one-or two-dimensional rocking curves instead.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Kossel, W. and Möllenstedt, G. (1939) Ann. der Physik 36, 113.
MacGillavry, C. (1940) Physica, 7, 329.
Ackermann, I. (1948) Ann.Phys. (Leipzig) 2, 41.
Goodman, P and Lehmpfuhl, G. (1964) Z. Naturforsch. 19a, 818; (1967) Acta Cryst. 22, 14.
Tanaka, M. and Terauchi, M. (1985) Convergent-Beam Electron Diffraction JEOL, Tokyo.
Goodman (1975) Acta Cryst A31, 793.
Buxton, B.F., Eades, J.A., Steeds, J.W. and Rackham G.M. (1976) Phil Trans R.Soc. London 281, 171.
Tanaka,M. Saito R and Sekii H. (1983) Acta Cryst A39, 357; Tanaka M. Sekii, H. and Nagasawa, T. ibid, 825.
Spence, J.C.H. and Zuo, J.M. (1992) Electron Microdiffraction Plenum, New York.
Reimer,L. (1989) Transmission Electron Microscopy 2.ed. Springer, Berlin.
Olsen, A. (1992) in A.J.C. Wilson, ed. International Tables of Crystallography Kluwer, Dordrecht vol C, pp 463.
Gunnæs, A. and Olsen, A. to be published.
Watanabe, D., Uyeda, R. and Fukuhara, A. (1969) Acta Cryst. A25, 138.
Gjönnes, J, and Hpier, R. (1971) Acta Cryst. A27, 313.
Gjßnnes, K.,Gjonnes, J, Zuo, J. and Spence, J.C.H. (1988) Acta Cryst A44, 810.
Holmestad, R. (1994) Quantitative Electron Diffraction, Dissertation University of Trondheim.
Gjpnnes, K. and Boe, N. (1994) Micron and Microscopy Acta 25, 29.
Cheng, Y.F., Niichter, W, Mayer, J., Weickenmeier, A. and Gjonnes, J. (1996) Acta Cryst. A52, 923.
Tafto, J. & GjOnnes, J. (1985) Ultramicrscopy 17, 329.
Moodie, A.F., Etheridge, J. and Humphreys, C.J. (1996) Acta Cryst A52, 596.
Gjpnnes, J and Moodie,A.F (1965) Acta Cryst. 19, 65.
Gjonnes, J and Taftp, J. (1993) Ultramicroscopy 52, 445.
Matsuhata, H. and Gjpnnes, J. (1994) Acta Cryst. A50, 107; Matsuahta, H., Gjpnnes, J. and Taftq, J. ibid, 115.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1997 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Gjønnes, J. (1997). Convergent Beam Electron Diffraction Basic principles. In: Dorset, D.L., Hovmöller, S., Zou, X. (eds) Electron Crystallography. NATO ASI Series, vol 347. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-8971-0_6
Download citation
DOI: https://doi.org/10.1007/978-94-015-8971-0_6
Publisher Name: Springer, Dordrecht
Print ISBN: 978-90-481-4965-0
Online ISBN: 978-94-015-8971-0
eBook Packages: Springer Book Archive