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Tem Studies of the Early Stages of Precipitation in Al-Mg-Si Alloys in Comparison with Electron Radiation Damage Effects

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Electron Crystallography

Part of the book series: NATO ASI Series ((NSSE,volume 347))

Abstract

Al alloys containing Mg and Si are used in an increasing number of technical applications. These alloys have a high specific strength (yield strength / density) that is caused by the formation of small precipitates (Guinier-Preston zones GPZ). There is some confusion in the literature about the first stages of the precipitation process, since it was not possible to image the very small precipitates. It is the aim of the present study to investigate the early stages of precipitation by high resolution transmission electron microscopy (HRTEM). The GPZ have to be distinguished from defects induced by the electron radiation during the investigation in the electron microscope.

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References

  1. Sagalowicz, L., Lapasset, G. and Hug, G. (1996) Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system, Phil. Mag. Lett. 74, 57–66.

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  2. Mingler, M. and Karnthaler, H. P. (1993) TEM Investigations of Al 6061 and of Composites Reinforced with Al2O3 Particles, Z. Metallkd. 84, 313–319.

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  3. Mingler, B. and Karnthaler, H. P. (1994) Electron Radiation Damage in Al-Mg-Si Alloys Caused by ‘l’EM Studies, in B. Jouffrey and C. Colliex (eds.), Proc.13 6 ’ Intern. Congr. on Electron Micr., Les Editions de Physique, Les Ulis, Paris, 2A, 103–104.

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© 1997 Springer Science+Business Media Dordrecht

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Mingler, B., Karnthaler, H.P. (1997). Tem Studies of the Early Stages of Precipitation in Al-Mg-Si Alloys in Comparison with Electron Radiation Damage Effects. In: Dorset, D.L., Hovmöller, S., Zou, X. (eds) Electron Crystallography. NATO ASI Series, vol 347. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-8971-0_40

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  • DOI: https://doi.org/10.1007/978-94-015-8971-0_40

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-90-481-4965-0

  • Online ISBN: 978-94-015-8971-0

  • eBook Packages: Springer Book Archive

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