Abstract
For the structure analysis of crystalline materials, electron crystallographic methods are in some cases superior to X-ray methods. First, many crystalline materials important in science and technology, such as high T C superconductors, are too small in grain size and too imperfect in periodicity for an X-ray single crystal analysis to be carried out, but they are suitable for electron microscopic observation. Secondly the atomic scattering factors for electrons differ greatly from those for X-rays and it is easier for electron diffraction to observe light atoms in the presence of heavy atoms (see figure 1). Finally the electron microscope is the only instrument that can produce simultaneously for a crystalline sample a micrograph and a diffraction pattern corresponding to atomic resolution. In principle either the electron micrograph (EM) or the electron diffraction (ED) pattern could lead to a structure image. However the combination of the two will make the procedure much more efficient and powerful [1].
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Fan, HF. et al. (1997). Multi-Dimensional Electron Crystallography of Bi-Based Superconductors. In: Dorset, D.L., Hovmöller, S., Zou, X. (eds) Electron Crystallography. NATO ASI Series, vol 347. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-8971-0_24
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DOI: https://doi.org/10.1007/978-94-015-8971-0_24
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