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Field Electron Emission from Atomic-Size Microtips

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Book cover Scanning Tunneling Microscopy and Related Methods

Part of the book series: NATO ASI Series ((NSSE,volume 184))

Abstract

The influence of quantum size effects and atomic geometry on the field emission characteristics (energy distribution, intensity-voltage, angular spread of the emitted beam, resolution) of atomic-size microtips is analyzed. Theoretical models are propose to analyze the influence of atomic-size protrusions on the properties of the emitted beam. It is shown that a tip with a small protrusion can be used as a source of very collimated electron beams. The conditions under which is it possible to obtain atomic resolution are discussed. Simple formulas relating the angular spread and the resolution with the experimental parameters are presented. Field emission experiments on “build up” and “teton” tips are presented together with the basic principles of the fabrication technique.

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References

  1. Garcia N. and Rohrer H. (1989) J. Phys Cond. Matt. 1, 3737

    Article  Google Scholar 

  2. Serena P., Escapa L., Sáenz J.J., García N., and Rohrer H. (1988) J. Microscopy, 152, 43

    Article  Google Scholar 

  3. Gabor D. (1949) Proc. Roy. Soc. London A54, 197

    Google Scholar 

  4. Gabor D. (1951) Proc. Roy. Soc. London B64, 449

    Google Scholar 

  5. Lichte H. (1986) Ultramicroscopy 20, 293

    Article  CAS  Google Scholar 

  6. Tonomura A. (1987) Rev. Mod. Phys. 59, 639

    Article  CAS  Google Scholar 

  7. Missiroli F.G., Pozzi G. and Valdre U. (1981) J. Phys. E 14, 649

    Article  CAS  Google Scholar 

  8. Binnig G. and Rohrer H. (1986) IBM J. Res. and Develop. 30, 355

    CAS  Google Scholar 

  9. Kuk Y. and Silverman P.J. (1986) Appl. Phys. Lett. 48, 1597–1600

    Article  CAS  Google Scholar 

  10. Hashizume T., Kamiya I., Hasegawa Y., Sano N., Sakurai T., and Pickering H.W. (1988) J. Microscopy 152, 347

    Article  CAS  Google Scholar 

  11. Nishikawa O., Tomitori M. and Katsuki F. (1988) J. Microscopy 152, 347

    Article  Google Scholar 

  12. Vu Thien Binh and Marien J. (1988) Surface Science 102, L539

    Article  Google Scholar 

  13. Vu Thien Binh (1988) J. Microscopy 152, 355

    Article  Google Scholar 

  14. Van Wees B.J., Van Houten H., Beenakker J., Williamson J.G., Kouwenhoven L.P., van der Maret D. and Foxon C.T. (1988) Phys. Rev. Lett. 60, 848

    Article  Google Scholar 

  15. Whararn D.A., Thorton T.J., Newbury R., Pepper M., Ahmed H., Frost J.E.F., Hasko D.G., Peacock D.C., Ritchie D.A. and Jones, G.A.G. (1988) J. Phys. C 21 L209

    Article  Google Scholar 

  16. Escapa L. and Garcia N. (1989) in this Proceedings, and references therein

    Google Scholar 

  17. Garcia N., Saenz J.J. and H. De Raedt (1989) J. Phys. Condens. Matt. (in press)

    Google Scholar 

  18. Rose D.J. (1956) J. Appl. Phys. 27, 215

    Article  CAS  Google Scholar 

  19. Sáenz J.J., Garcia N., De Raedt H. and Vu Thien Binh (1989) in “Proceedings of the 36th Field Emission Symposium”, Oxford (to appear in J. de Physique).

    Google Scholar 

  20. Vu Thien Binh, Saenz J.J., De Raedt H., and Garcia H. (1989) to be published.

    Google Scholar 

  21. A general discussion of the emission characteristics of 2D systems including applications to GaAs devices and light experiments can be found in ref. 17

    Google Scholar 

  22. Gomer R. (1961) “Field Emission and Field Ionization”, (Harvard University, Cambridge Mass.)

    Google Scholar 

  23. De Raedt H. (1987) Comp. Phys. Rep. 7, 1

    Article  Google Scholar 

  24. Smythe W.R. (1952) “Static and Dynamic Electricity”, McGraw Hill, New York

    Google Scholar 

  25. Dyke W.P. and Dolan W.W. (1956) in “Advances in Electronics and Electron Physics”, 8 (Academic Press, New York)

    Google Scholar 

  26. Herring C. (1953) in “Structure and Properties of Solid surfaces” Editors R. Gomer and C.S. Smith, Univ. of Chicago Press.

    Google Scholar 

  27. Mullins W.W. (1957) J.Appl.Phys. 28, 333.

    Article  CAS  Google Scholar 

  28. Nichols F.A. and Mullins W.W. (1965) Trans.Met.Soc. AIME 233, 1840.

    CAS  Google Scholar 

  29. Vu Thien Binh, Piquet A., Roux H., Uzan R., and Drechsler M. (1971) Surface Sci. 25, 348.

    Article  Google Scholar 

  30. Sokolovskaia I.L. (1956) Sov.Phys.Techn. 1, 1147.

    Google Scholar 

  31. Drechsler M. (1983) in “Surface Mobilities on Solid Materials: Fundamental Concepts and Applications”, Editor Vu Thien Binh, Plenum Press, NATO ASI Series B 86, pp.405).

    Google Scholar 

  32. Plummer E.W. and Rhodin T.N. (1969) J.Chem.Phys. 49, 3473.

    Google Scholar 

  33. Tsong T.T. (1983) in “Surface Mobilities on Solid Materials: Fundamental Concepts and Applications” Editor Vu Thien Binh, Plenum Press, NATO ASI Series B 86, pp.109).

    Google Scholar 

  34. Drechsler M. (1957) Z.Elektrochemie 61, 48.

    CAS  Google Scholar 

  35. J.P. Barbour, Charbonnier F.M., Dolan W.W., Dyke W.P., Martin E.E., and Trolan J.K. (1960) Phys.Rev. 117, 1452.

    Article  CAS  Google Scholar 

  36. P.C. Bettler P.C. and Charbonnier F.M. (1960) Phys.Rev. 119, 85.

    Article  CAS  Google Scholar 

  37. Neddermeyer H. and Drechsler M. (1988) J. of Microscopy 152, 459.

    Article  CAS  Google Scholar 

  38. Vu Thien Binh, Piquet A., Roux H., Uzan R., and Drechsler M. (1974) Surface Sci. 44, 598.

    Article  Google Scholar 

  39. Vu Thien Binh and Uzan R. (1987) Surface Sci. 179, 540.

    Article  Google Scholar 

  40. Muller E.W. and Tsong T.T. (1969) in “Field Ion Microscopy: Principles and Applications”, American Elsevier Publ. Co.

    Google Scholar 

  41. Lang N.D., Jacoby A. and Imry Y. (1989) to be published

    Google Scholar 

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© 1990 Springer Science+Business Media Dordrecht

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Saenz, J.J., Garcia, N., Vu, T.B., De Raedt, H. (1990). Field Electron Emission from Atomic-Size Microtips. In: Behm, R.J., Garcia, N., Rohrer, H. (eds) Scanning Tunneling Microscopy and Related Methods. NATO ASI Series, vol 184. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-7871-4_24

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  • DOI: https://doi.org/10.1007/978-94-015-7871-4_24

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-90-481-4075-6

  • Online ISBN: 978-94-015-7871-4

  • eBook Packages: Springer Book Archive

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