Abstract
This paper deals with point sources for charged particles. The importance of a well-characterized ensemble of particles in the framework of the quantum mechanical measuring process is illustrated. The engineering of these sources for electrons and noble gas ions and their emission properties are reviewed. Two practical microscopy applications, the resolution of which depends on the “quality” of the particle beam, are presented.
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© 1990 Springer Science+Business Media Dordrecht
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Fink, HW. (1990). Electron and Ion Point Sources, Properties and Applications. In: Behm, R.J., Garcia, N., Rohrer, H. (eds) Scanning Tunneling Microscopy and Related Methods. NATO ASI Series, vol 184. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-7871-4_23
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DOI: https://doi.org/10.1007/978-94-015-7871-4_23
Publisher Name: Springer, Dordrecht
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