Abstract
An energy dispersive x-ray fluorescence spectrometer differs from a wavelength dispersive instrument in that, instead of being based on a Bragg diffracting crystal, the spectrometer uses a solid state ‘lithium drifted silicon detector’ (i.e. Si(Li)) to measure the fluorescence spectrum. Operating principles of the rest of the instrument and practice in analytical applications broadly follow those of the conventional wavelength dispersive technique.
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Potts, P.J. (1987). Energy dispersive x-ray spectrometry. In: A Handbook of Silicate Rock Analysis. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-3988-3_9
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DOI: https://doi.org/10.1007/978-94-015-3988-3_9
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