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X-ray fluorescence analysis: principles and practice of wavelength dispersive spectrometry

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A Handbook of Silicate Rock Analysis

Abstract

X-ray fluorescence spectrometry is a technique for the analysis of bulk specimens. Samples are prepared as compressed powder pellets or fused glass discs and excited with x-ray radiation, normally generated by an x-ray tube operated at a potential of between 10 and 100 kV. Interaction of this primary radiation with atoms of the sample causes ionization of discrete orbital electrons. During the subsequent electronic rearrangement by which the atom then de-excites back to the ground state, fluorescence x-rays of energy characteristic of that element are emitted. The emission intensity of this characteristic radiation is measured with a suitable x-ray spectrometer and compared with that from a standard sample. The technique is one of the most widely used routine instrumental methods of analysing rock samples both for the major elements Na, Mg, Al, Si, P, K, Ca, Ti, Mn, Fe and selected trace elements, including Rb, Sr, Y, Nb, Zr, Cr, Ni, Cu, Zn, Ga, Ba, Pb, Th, and U. Detection limits for many of these trace elements lie in the range 1 to 10 ppm rock under routine operating conditions.

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  1. Research Fellow in Earth Sciences, The Open University, Milton Keynes, UK

    P. J. Potts

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© 1987 Springer Science+Business Media New York

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Potts, P.J. (1987). X-ray fluorescence analysis: principles and practice of wavelength dispersive spectrometry. In: A Handbook of Silicate Rock Analysis. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-3988-3_8

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  • DOI: https://doi.org/10.1007/978-94-015-3988-3_8

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-015-3990-6

  • Online ISBN: 978-94-015-3988-3

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