Abstract
The challenge for the in-circuit tester is to achieve greater throughput with a higher yield. This challenge requires compatible hardware and software for fast test program generation and execution.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Rights and permissions
Copyright information
© 1985 Van Nostrand Reinhold Company Inc.
About this chapter
Cite this chapter
Bateson, J. (1985). In-Circuit Tester. In: In-Circuit Testing. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-7009-3_7
Download citation
DOI: https://doi.org/10.1007/978-94-011-7009-3_7
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-011-7011-6
Online ISBN: 978-94-011-7009-3
eBook Packages: Springer Book Archive