Abstract
Built-in test approaches offer significant opportunities for lowering the overall cost of testing both in the factory and in the field. Built-in test features in new designs reduce system integration costs, field service costs, and printed circuit board test and repair costs while providing customers with higher system availability (uptime).
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© 1990 Jon Turino
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Turino, J.L. (1990). Built-In Test Approaches. In: Design to Test. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-6044-5_9
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DOI: https://doi.org/10.1007/978-94-011-6044-5_9
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-011-6046-9
Online ISBN: 978-94-011-6044-5
eBook Packages: Springer Book Archive