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Millimeter Measurements

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New Directions in Terahertz Technology

Part of the book series: NATO ASI Series ((NSSE,volume 334))

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Abstract

This paper discusses component and device characterization for the microwave and millimeter frequency range. There will be an overview of the basic measurement techniques followed by an update on the present millimeter measurement methods and systems. Please see reference [1] for a good overview of general microwave measurement history.

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References

  1. Adam, S. F., (1984) Microwave Instrumentation: An Historical Perspective, IEEE Trans, on Microwave Theory and Techniques, MTT-329, 1157 – 1160, Sept..

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Author information

Authors and Affiliations

  1. Santa Rosa Systems Division, Hewlett Packard, 1400 Fountain Grove Parkway, Santa Rosa, California, 95403, USA

    D. K. Rytting

Authors
  1. D. K. Rytting
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Editor information

Editors and Affiliations

  1. Department of Physics, The University of Nottingham, Nottingham, NG7 2RD, Great Britain

    J. M. Chamberlain

  2. Department of Electronic & Electrical Engineering, The University of Leeds, Leeds, LS2 9JT, Great Britain

    R. E. Miles

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© 1997 Kluwer Academic Publishers

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Rytting, D.K. (1997). Millimeter Measurements. In: Chamberlain, J.M., Miles, R.E. (eds) New Directions in Terahertz Technology. NATO ASI Series, vol 334. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5760-5_22

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  • DOI: https://doi.org/10.1007/978-94-011-5760-5_22

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-4537-4

  • Online ISBN: 978-94-011-5760-5

  • eBook Packages: Springer Book Archive

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