Abstract
Spectromicroseopy and microspectroscopy have attracted considerable attention during the past five years, and technical concepts to achieve high spatial resolution using the information from different electron spectroscopies have successfully been installed at various synchrotron sources [1–5]. Two different concepts of photoelectron microscopes have been realized using scanning and imaging techniques, respectively, both of which have proven their advantages in the study of fundamental as well as applied research problems. Most concepts were presented during this workshop and shall therefore not be described here.
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References
B. P. Tonner and G. R. Harp, „Photoelectron microscopy with synchrotron radiation“, Rev. Sci. Instrum., 69 (6), p. 852 (1988). B. P. Tonner, this workshop.
C. Capasso, A. K. Ray-Chaudhuri, W. Ng, S. Liang, R. K. Cole, J. Wallace, F. Cerrina, G. Margaritondo, J. H. Underwood, J. B. Kortright, and R. C. C. Perera, „High-resolution x-ray microscopy using an undulator source, photelectron studies with MAXIMUM“, J. Vac. Sci. Technol., A9 (3), p. 1248 (1991). G. Margaritondo and F. Cerrina, this workshop.
H. Ade, J. Kirz, S. L. Hulbert, E. D. Johnson, E. Anderson, and D. Kern, „X-ray spectromicroscopy with a zone plate generated microprobe“, Appl. Phys. Lett, 56 (19), pp. 1841–1843 (1990). H. Ade, this workshop.
J. Voss, H. Dadras, C. Kunz, A. Moewes, G. Roy, H. Sievers, I. Storjohann, and H. Wongel, „A Scanning Soft X-Ray Microscope with an Ellipsoidal focusing Mirror“, J. X-Ray Sci. Techn., 3, p. 85 (1992).
E. Bauer,„Low Energy Electron Microscopy“, Ultramicroscopy, 36, p. 52 (1991).E. Bauer, this workshop.
V. Wüstenhagen, M. Schneider, J. Taborski, W. Weiss, and E. Umbach, „Concept and realization of a photon-induced scanning Auger microscope“, Vacuum, 41(7-9), p. 1577 (1990).
V. Wüstenhagen, Doctoral Thesis, Universität Stuttgart, July 1992.
M. Weiss, Diploma Thesis, Universität Stuttgart, January 1993.
P. Väterlein, M. Weiss, V. Wüstenhagen and E. Umbach,“Mask-less writing of microstructures with the PISAM“, Appl. Surf. Sci., 70/71, p. 278 (1993).
P. Väterlein, V. Wüstenhagen, and E. Umbach, „Direct writing of Mo microstructures using high brilliance synchrotron radiation“, Appl. Phys. Lett. 66(17) p. 2200 (1995)
M. Weiss, V. Wüstenhagen, and E. Umbach, „A grazing incidence mirror for a new microspectroscope using soft X-ray undulator radiation“ Proceedings SPIE, p. 1 (San Diego 1994)
H. Rose, and D. Preikszas,“Outline of a versatile corrected LEEM“ Optik 92(1) p. 31 (1992); D. Preikszas and H. Rose, „Corrected LEEM for Multimode Operation“ Proceedings ICEM-13 (Paris 1994) p. 197
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© 1997 Springer Science+Business Media Dordrecht
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Fink, R., Weiss, M.R., Wüstenhagen, V., VÄterlein, P., Umbach, E. (1997). Some Spectromicroscopy Developments at Bessy. In: Rosei, R. (eds) Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale. NATO ASI Series, vol 333. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5724-7_6
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DOI: https://doi.org/10.1007/978-94-011-5724-7_6
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