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D.C. and R.F. Field Induced Losses in HTS Thin Films

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Microwave Physics and Techniques

Part of the book series: NATO ASI Series ((ASHT,volume 33))

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Abstract

It is paramount to microwave device design, that a firm understanding of the loss mechanisms in High Temperature Superconducting (HTS) thin films is reached. An important factor in the practical performance of these films is the dependence of the microwave surface impedance (ZS=RS+iXS) upon r.f. power. We have used a parallel plate resonator to investigate the nonlinearity of surface impedance for a range of thin films as a function of d.c. and r.f. field. The surface impedance performance is studied using the ratio r(Hdc, Hrf)=ΔXs(Hdc, Hrf)/ΔRs(Hdc, Hrf) which allows us to distinguish between films.

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References

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Author information

Authors and Affiliations

  1. Centre for High Temperature Superconductivity, Imperial College, London, SW7 2BZ, UK

    A. L. Cowie & L. F. Cohen

  2. National Physical Laboratory, Teddington, Middlesex, TW11 OLW, UK

    J. C. Gallop

  3. KFA-IFF, 52425, Jülich, Germany

    I. S. Ghosh

Authors
  1. A. L. Cowie
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  2. L. F. Cohen
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  3. J. C. Gallop
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  4. I. S. Ghosh
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Editor information

Editors and Affiliations

  1. Microwave Department, Technical University of Munich, Germany

    Horst Groll

  2. Institute of Electronics, Bulgarian Academy of Sciences, Sofia, Bulgaria

    Ivan Nedkov

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© 1997 Springer Science+Business Media Dordrecht

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Cowie, A.L., Cohen, L.F., Gallop, J.C., Ghosh, I.S. (1997). D.C. and R.F. Field Induced Losses in HTS Thin Films. In: Groll, H., Nedkov, I. (eds) Microwave Physics and Techniques. NATO ASI Series, vol 33. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5540-3_27

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  • DOI: https://doi.org/10.1007/978-94-011-5540-3_27

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6333-3

  • Online ISBN: 978-94-011-5540-3

  • eBook Packages: Springer Book Archive

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