Abstract
This paper describes some of our contributions in the nonlinear optics in semiconductors: the accurate description of the light self-diffraction on the highly modulated dynamic gratings (particularly, in c-Si); the comparison of the third-order susceptibility values of semiconductors obtained by measurements in self-diffraction and phase conjugation with those produced by the theoretical models; the se?f-diffraction on anharmonic phase gratings generated in photorefractive materials (particularly, in sillenites) and an all-optical method for the measurement of the electro-optical coefficient using the laser light self-diffraction in the photorefractive materials; the holographic interferometry based on phase conjugation in sillenites.
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Vlad, V.I., Petris, A. (1997). Contributions to Self-Diffraction and Optical Phase Conjugation in Semiconductors. In: Andriesh, A., Bertolotti, M. (eds) Physics and Applications of Non-Crystalline Semiconductors in Optoelectronics. NATO ASI Series, vol 36. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5496-3_13
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DOI: https://doi.org/10.1007/978-94-011-5496-3_13
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