Abstract
The modern transmission electron microscope (TEM) is a powerful tool for the study of a wide range of magnetic materials currently under development. The primary motivation for its use is that many applicable magnetic properties are extrinsic rather than intrinsic to the materials themselves. Hence a detailed knowledge of both the physical and magnetic microstructure is essential if the structure-property relation is to be understood and materials with optimised properties produced. Many of the materials of interest are markedly inhomogeneous with features requiring resolution on a sub-50nm scale for their detailed investigation. Hence the attraction of TEM is two-fold. It offers very high spatial resolution and, because of the large number of interactions that take place when a beam of fast electrons hits a thin solid specimen, detailed insight into compositional, electronic, as well as structural and magnetic, properties. The resolution that is achievable depends largely on the information sought and may well be limited by the specimen itself. Typical resolutions achievable for structural imaging are 0.2–1.0nm, for extraction of compositional information l–3nm and for magnetic imaging 2–20nm.
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© 1997 Springer Science+Business Media Dordrecht
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Chapman, J.N., Kirk, K.J. (1997). Imaging Magnetic Structures in the Transmission Electron Microscope. In: Hadjipanayis, G.C. (eds) Magnetic Hysteresis in Novel Magnetic Materials. NATO ASI Series, vol 338. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5478-9_19
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DOI: https://doi.org/10.1007/978-94-011-5478-9_19
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