Abstract
We have performed detailed measurements of the charge transfer efficiency (CTE) in a thinned, backside-illuminated imaging CCD. The device had been damaged in three separate sections by proton radiation typical of that which a CCD would receive in space-borne experiments, nuclear imaging or particle detection. We examined CTE as a function of temperature, clock rate and radiation dose.
The dominant factor affecting the CTE in radiation-damaged CCDs is seen to be trapping by bulk states. We present a simple physical model for trapping as a function of transfer rate, trap concentration and temperature. We have made calculations using this model and arrived at predictions that closely match the measured results.
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© 1998 Springer Science+Business Media Dordrecht
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Hardy, T., Deen, M.J., Murowinski, R. (1998). Charge Transfer Efficiency in Proton Damaged CCDs. In: Beletic, J.W., Amico, P. (eds) Optical Detectors for Astronomy. Astrophysics and Space Science Library, vol 228. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5262-4_34
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DOI: https://doi.org/10.1007/978-94-011-5262-4_34
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