Abstract
A statistical thermodynamic analysis of the atomic force microscope (AFM) is presented and applied to a single-atom tip moving quasistatically over a rigid substrate immersed in water. The RISM integral equation technique is used to compute the normal force (load) F z on the tip as a function of its height above the substrate. F z is found to be oscillatory, which implies that multiple scanning trajectories of the tip are possible under constant load. The unique trajectory along which the system is thermodynamically stable is revealed. This study shows that the tip may undergo hopping motion even over a defect-free substrate, due to layering of water molecules between the tip and substrate.
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© 1998 Springer Science+Business Media Dordrecht
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Koga, K., Zeng, X.C., Diestler, D.J. (1998). Statistical Thermodynamic Treatment of the AFM Tip in Liquid. In: Bhushan, B. (eds) Tribology Issues and Opportunities in MEMS. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5050-7_23
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DOI: https://doi.org/10.1007/978-94-011-5050-7_23
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-6121-6
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