Abstract
The Scanning Force Microscope (SFM) has become a useful tool for the investigation of isolating surfaces with respect to their surface properties. Methods have been developed that enable the simultaneous mapping of topographic features and material properties like local stiffness, adhesive force or friction on nanometer scale [1–6]. During the last few years the characterizing of by chemical contrast, so called Chemical Force Microscopy (CFM) has become a field of great interest. First, the CFM has been performed using Friction Force Microscopy (FFM) [7–9]. Because FFM is performed in contact mode for soft sample often occurs the problem of destructive lateral forces. This complicates the investigation of delicate samples like polymers or organic materials.
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Hild, S., Krotil, U., Marti, O. (1998). Pulsed Force Mode: A new method for characterizing thin silane films by adhesive force measurements. In: Bhushan, B. (eds) Tribology Issues and Opportunities in MEMS. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5050-7_18
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DOI: https://doi.org/10.1007/978-94-011-5050-7_18
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