Abstract
Scanning near-field optical microscopy (SNOM) has pushed today’s optical resolution limit to about 20 nm, with a potential for improvement by another order of magnitude still remaining. SNOM provides chemical specificity based on spectral (amplitude, phase), polarization, and/or fluorescence contrast; it also allows dynamic studies with femtosecond time resolution and photochemistry on the nanometer scale. In spite of these prospects and considerable ongoing research efforts, progress in near-field optical microscopy has been rather slow in the past few years.
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Pohl, D.W., Hecht, B., Heinzelmann, H. (1998). Quo Vadis, Near-Field Optics?. In: García, N., Nieto-Vesperinas, M., Rohrer, H. (eds) Nanoscale Science and Technology. NATO ASI Series, vol 348. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5024-8_14
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DOI: https://doi.org/10.1007/978-94-011-5024-8_14
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