Abstract
Experiments using photons as a probe provide an excellent energy resolution. The wavelength of the light, however, sets a lower limit to the probed area perpendicular to the direction of propagation. This limit is of the order of the wavelength of the light. Scanning probe microscopes, on the other hand, have a superb spatial resolution. The energy of the interaction can only be acquired with modest sensitivity and resolution. Therefore, the combination of photons and local probes might provide the best of the two worlds. In this article we explore the possibilities of combining optical and SPM techniques. Near field optical microscopy using the aperture probe is used to investigate the emission properties of vertical cavity surface emitting laser diodes (VCSEL). Mode patterns put into relation to the topography of the emission area serve to diagnose the performance of the device. In contrast to classical optical microscopy techniques, our method is able to simultaneously decompose lasing transversal modes by their wavelength with lateral superresolution. Similarly, the comparison of the emission location of nanometer sized thin luminescent layers with the shape of the overgrown structure reveals variations of the bandgap and its position. Subtle differences in images obtained with internal and external collection modes provide clues to the diffusion of the charge carriers. Finally scanning force microscope (SFM) is used to detect near field light by a mechanism based on optical modulation of the image force between a semiconducting probe tip and a glass surface due to the surface photo-voltage (SPV). This technique, which has a lateral resolution of better than 70 nm, allows the simultaneous detection of minute optical powers as small as \(0.1pW/\sqrt {Hz}\) in air and of charges. The technique is applied to the measurement of optical and charge gratings of a photorefractive material.
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Marti, O. et al. (1998). Photons and Local Probes. In: García, N., Nieto-Vesperinas, M., Rohrer, H. (eds) Nanoscale Science and Technology. NATO ASI Series, vol 348. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5024-8_13
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DOI: https://doi.org/10.1007/978-94-011-5024-8_13
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