Skip to main content
SpringerLink
Log in
Book cover

Instrumental Multi-Element Chemical Analysis pp 438–491Cite as

Elemental analysis of surfaces

  • Chapter

  • 476 Accesses

Abstract

Atoms composing the surfaces of solids have different coordination numbers and bonding compared to bulk atoms, often leading to distinct surface structures and composition. Surface reconstructions and atomic redistributions have been observed often in single-crystal solids under clean (ultra-high-vacuum, UHV) conditions. Furthermore, being the first to encounter any interactions with an external environment, the highly reactive surface atoms (especially in a metal) quite rapidly adsorb gas molecules. This can lead to structural reconstruction and compositional redistribution (e.g. of alloy constituents). Thus, the chemical composition of the surface region in a multicomponent material usually differs from the bulk composition as a result of ‘surface segregation’, either of intrinsic nature, or extrinsically induced by preferential chemical interactions with adsorbed species. The chemical identity and distribution of the superficial layer or contamination on mono- and multi-element solids are of interest as well. Diverse processes can occur at thin or ultra-thin film surfaces and interfaces, such as segregation and interdiffusion in semiconductor heterostructures.

This is a preview of subscription content, log in via an institution.

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   79.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   99.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  • Benninghoven, A., Nihei, Y., Shimizu, R. and Werner, H.W. (eds) (1994), Secondary Ion Mass Spectrometry SIMS IX, John Wiley & Sons, Chichester, pp. 89.

    Google Scholar 

  • Briggs, D. and Seah, M.P. (eds) (1990), Practical Surface Analysis, vol. 1, Auger and X-ray Photoelectron Spectroscopy, John Wiley & Sons, Chichester.

    Google Scholar 

  • Briggs, D. and Seah, M.P. (eds) (1992), Practical Surface Analysis, vol. 2, Ion and Neutral Spectroscopy, John Wiley & Sons, Chichester.

    Google Scholar 

  • Casalis, L., Gregoratti, L., Kishinova, M. et al.(1997), Surf Interface Anal. 25, 374.

    Article  CAS  Google Scholar 

  • Certified Reference Material (1983), BCR No. 261 (NPL No. S7B83).

    Google Scholar 

  • Chatelier, R.C., St. John, H.A.W., Gengenbach, T.R et al.(1997), Surf. Interface Anal. 25, 741–746.

    Article  CAS  Google Scholar 

  • Childs, K.D., Narum, D., La Vanier, L.A. et al.(1996), J. Vac. Sci. Technol. A14(4), 2392–2404.

    Google Scholar 

  • Clegg, J.B. (1987), Surf Interface Anal. 10, 332.

    Article  CAS  Google Scholar 

  • Clegg, J.B. (1995), J. Vac. Sci. Technol. A13, 143.

    Google Scholar 

  • Cumpson, P.J. (1995), J. Electron Spectrosc. Relat. Phenom. 43, 25–52.

    Article  Google Scholar 

  • Cumpson, P.J. and Seah, M.P. (1997), Surf. Interface Anal. 25, 430–446.

    Article  CAS  Google Scholar 

  • Davis, L.E., MacDonald, N.C., Palmberg, P.W. et al.(1978), Handbook of Auger Electron Spectroscopy,Physical Electronics Inc., Eden Prairie, MN 55344, USA.

    Google Scholar 

  • Feldman, L.C. and Mayer, J.W. (1986), Fundamentals of Surface and Thin Film Analysis,Elsevier Science-NL, Sara Burgerhartst. 25, 1055 KV Amsterdam, Netherlands, p. 223.

    Google Scholar 

  • Gnaser, H. (1997a), J. Vac. Sci. Technol. A15(3), 445–450.

    Google Scholar 

  • Gnaser, H. (1997b), Surf Interface Anal. 25, 737–740.

    Article  CAS  Google Scholar 

  • Grant, J.T. (1989), Surf. Interface Anal. 14 271–283.

    Article  Google Scholar 

  • Gunter, P.L.J., Gijzeman O.L.J. and Niemantsverdriet, J.W. (1997), Appl. Surf Sci. 115, 342–346.

    Article  CAS  Google Scholar 

  • Guo, H., Maus-Friedrichs, W. and Kempter, V. (1997), Surf Interface Anal. 25, 390–396.

    Article  Google Scholar 

  • Guttierez, A., Lopez, M.F., Garcia, I. and Vazquez, A. (1997), J. Vac. Sci. Technol. A15(2), 296.

    Google Scholar 

  • Hall, P.M. and Morabito, J.M. (1979), Surf Sci. 83, 391–405.

    Article  CAS  Google Scholar 

  • Jablonsky, A. and Powell, C.J. (1997), J. Vac. Sei. Technol. A15(4), 2095–2106.

    Article  Google Scholar 

  • Langeron, J.P. (1989), Surf Interface Anal. 14, 381–387.

    Article  Google Scholar 

  • Leveque, G. and Bonnet, J. (1995), Appl. Surf Sci. 89, 211–219.

    Article  CAS  Google Scholar 

  • Lopez, S., Donlop, H.M., Benmalek, M. et al.(1997), Surf. Interface Anal. 25, 315–323.

    Article  CAS  Google Scholar 

  • Matsumoto, Y., Aibara, Y. Mukai, K. et al.(1997), Surf Sci. 311/ 379 32–37.

    Article  Google Scholar 

  • Moon, D.W. and Kim, K.J. (1996), J. Vac. Sci. Technol. A14(5), 2744–2756.

    Google Scholar 

  • Newman, J.G. and Carlson, B.A., Michael, R.S. et al.(undated), Static SIMS Handbook of Polymer Analysis,Physical Electronics Inc., 6509 Flying Cloud Dr, Eden Prairie, MN 55344, USA.

    Google Scholar 

  • Polak, M. (1994), Determination of trace elements by electron spectroscopic methods, in Determination of Trace Elements(ed. Z.B. Alfassi), VCH, Weinheim, pp. 359–392.

    Chapter  Google Scholar 

  • Polak, M., Baram, J. and Pelleg, J. (1983), Archaeometry, 25, 59–67.

    Article  CAS  Google Scholar 

  • Powell, C.J. and Seah, M.P. (1990), J. Vac. Sci. Technol A5, 735.

    Google Scholar 

  • Procop, M. and Weber, E.-H. (1990), Surf Interface Anal. 15, 583–584.

    Article  CAS  Google Scholar 

  • Reichlmaier, S. (1992), PHI Interface, 14(2), 1–16, Physical Electronics Inc., 6509 Flying Cloud Dr, Eden Prairie, MN 55344, USA.

    Google Scholar 

  • Satory, K., Haga, Y., Minatoya, R. et al. (1997), J. Vac. Sci. Technol. A15(3), 468–484.

    Google Scholar 

  • Seah, M.P. and Dench, W.A. (1979), Surf Interface Anal. 1, 2–11.

    Article  CAS  Google Scholar 

  • Seah, M.P. and Gilmore, I.S. (1996), J. Vac. Sei. Technol. 14, 1401.

    Article  CAS  Google Scholar 

  • Seal, S., Barr, T.L., Sobczak, N. et al.(1997), J. Vac. Sci. Technol. A15(3), 505–512.

    Google Scholar 

  • Shiffman, B. and Polak, M. (1986), Surf. Interface Anal. 9, 151–155.

    Article  Google Scholar 

  • Shirley, D.A. (1972), Phys. Rev. B5, 4709.

    Google Scholar 

  • Silvain, J.F., Turner, M.R. and Lahaye, M. (1996), Composites 21A 793–798.

    Google Scholar 

  • Tanuma, S., Powell, C.J. and Penn, D.R. (1991), Surf. Interface Anal. 17, 911–926.

    Article  CAS  Google Scholar 

  • Tougaard, S. (1996a), Appl. Surf Sci. 100/101, 1–10.

    Google Scholar 

  • Tougaard, S. (1996b), J. Vac. Sci. Technol A14(3), 1415–1423.

    Google Scholar 

  • Tougaard, S. and Jansson, C. (1992), Surf Interface Anal. 19, 171–174.

    Article  CAS  Google Scholar 

  • Tyler, B.J., Gastner, D.G. and Ratner, B.D. (1989), Surf Interface Anal. 14, 443–450.

    Article  CAS  Google Scholar 

  • Wagner, C.D. (1983), J. Electron Spectrosc. Relat. Phenom. 32, 99–102.

    Article  CAS  Google Scholar 

  • Wagner, C.D. (1990), Photoelectron and Auger energies and the Auger parameter: a data set, in Practical Surface Analysis—Vol. 1, Auger and x-ray photoelectron spectroscopy(eds Brigg, D. and Seah, M.P.), John Wiley & Sons, Chichester, Appendix 5.

    Google Scholar 

  • Wagner, CD., Riggs, W.M., Davis, L.E. et al.(1979), Handbook of X-ray Photoelectron Spectroscopy,Physical Electronics Inc., Eden Prairie, MN 55344, USA.

    Google Scholar 

  • Wagter, M.L., Clarke, A.H., Taylor, K.F. et al.(1997), Surf Interface Anal. 25, 788–789.

    Article  CAS  Google Scholar 

  • Werner, W.S.M., Gries, W.H. and Stori, H. (1991), Surf Interface Anal 17, 693–704.

    Article  CAS  Google Scholar 

  • Wittenaack, K. and Clegg, J.B. (1980), Appl Phys. Lett. 37, 285.

    Article  Google Scholar 

  • Yoshitake, M. and Yoshihara, K. (1997), Internet Database of AES and XPS Spectra,National Research Institute for Metals, Japan. E-mail: michystk@nrim.go.jp

    Google Scholar 

  • Zalar, A. (1986), Surf Interface Anal 9, 41.

    Article  CAS  Google Scholar 

Download references

Authors
  1. M. Polak
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. Department of Nuclear Engineering, Ben-Gurion University of the Negev, Beer-Sheeva, Israel

    Z. B. Alfassi

Rights and permissions

Reprints and permissions

Copyright information

© 1998 Springer Science+Business Media Dordrecht

About this chapter

Cite this chapter

Polak, M. (1998). Elemental analysis of surfaces. In: Alfassi, Z.B. (eds) Instrumental Multi-Element Chemical Analysis. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4952-5_11

Download citation

  • DOI: https://doi.org/10.1007/978-94-011-4952-5_11

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6078-3

  • Online ISBN: 978-94-011-4952-5

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Search

Navigation