Abstract
Characterization of materials by scattering methods is based on the properties of the elastic collision between two charged atomic particles. In the ion beam analysis of materials, energetic ions from a particle accelerator are steered to strike the surface of a solid sample. Most of the incident ions penetrate the sample, gradually slowing down due to the energy exchange between the ion and the atoms and electrons of the medium. In these processes, the atoms of the solid are excited and ionized and the charge state of the ion is modified. A few of the ions experience encounters with the atoms close enough to produce significant change in the ion trajectories.
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Rauhala, E. (1998). Scattering methods. In: Alfassi, Z.B. (eds) Instrumental Multi-Element Chemical Analysis. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4952-5_10
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DOI: https://doi.org/10.1007/978-94-011-4952-5_10
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