Characterisation of powdery mildew resistant lines derived from crosses between Triticum aestivum and Aegilops speltoides and Ae. mutica

Eser, V.

doi:10.1007/978-94-011-4896-2_46

V. Eser⁶

Part of the book series: Developments in Plant Breeding ((DIPB,volume 6))

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Summary

Characterisation of introgressions of powdery mildew resistance into wheat from Aegilops speltoides and Ae. mutica was attempted by the application of cytological analysis of meiotic behaviour and molecular markers, based on isozymes and RAPD (random amplified polymorphic DNA). Cytological results suggest that a chromosome segment of Ae. speltoides has been successfully translocated to a wheat chromosome, while transfers from Ae. mutica appear to consist of whole chromosome substitutions. RAPD analysis detected eight bands in the line Sp1, and six bands in the line Mt1, which may be potential markers for powdery mildew (PM) resistance. In all Mt progenies the Ep-T1 product segregated, suggesting that the resistance gene is associated with the group 7 homoeologue in Ae. mutica.

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Central Research Institute for Field Crops, P. O. Box 226, Ulus, 06042, Ankara, Turkey
V. Eser

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V. Eser
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CIMMYT, PK 39, Emek, 06511, Ankara, Turkey
H.-J. Braun
Gecit Kusagi Tarimsal Arastirma Enstitusu, PK 17, Eskisehir, Turkey
F. Altay
Oregon State University, Crop Sci. Building 107, Corvallis, OR, 97331-3002, USA
W. E. Kronstad
ICARDA Highlands Program, PK 39, Emek, 06511, Ankara, Turkey
S. P. S. Beniwal
CIMMYT, Apdo Postal 6-641, Lisboa 27, Col. Juarez, 06600, Mexico D.F., Mexico
A. McNab

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Eser, V. (1997). Characterisation of powdery mildew resistant lines derived from crosses between Triticum aestivum and Aegilops speltoides and Ae. mutica . In: Braun, HJ., Altay, F., Kronstad, W.E., Beniwal, S.P.S., McNab, A. (eds) Wheat: Prospects for Global Improvement. Developments in Plant Breeding, vol 6. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4896-2_46

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DOI: https://doi.org/10.1007/978-94-011-4896-2_46
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-6053-0
Online ISBN: 978-94-011-4896-2
eBook Packages: Springer Book Archive

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