Abstract
Total and diffuse reflectance measurements together with scanning electron microscopy analysis performed on samples of TeflonĀ® FEP, textured by a novel ion-beam process, confirmed formation of surfaces with highly diffuse properties. At the same, measurements of solar absorptance and total emittance time indicated that the optical thermal properties of the modified surfaces did not change significantly and remained similar to these of the original, untreated Teflon surfaces.
No visible changes in colour and morphology or any measurable mass losses occurred in the textured Teflon samples when they were thermally-cycled or tested in an atomic oxygen space simulator facility.
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Ā© 1999 Springer Science+Business Media Dordrecht
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Kleiman, J.I., Popov, O., Tong, A., Molenda, D. (1999). Development of High Diffuse Reflectance Surfaces on Teflon. In: Kleiman, J.I., Tennyson, R.C. (eds) Protection of Materials and Structures from the Low Earth Orbit Space Environment. Space Technology Proceedings, vol 2. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-4768-2_14
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DOI: https://doi.org/10.1007/978-94-011-4768-2_14
Publisher Name: Springer, Dordrecht
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